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在“Elsevier电子期刊”中，命中：2,174条，耗时：0.2068972 秒

在所有数据库中总计命中：2,925条

1.Defects of clean graphene and sputtered graphite surfaces characterized by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy

作者：Wenjing Xie^a ; Lu-Tao Weng^b ; ^c ; Kai Mo Ng^d ; Chak K. Chan^a ; ^b ; ^e ; Chi-Ming Chan^a ; ^b ; ^{kecmchan@ust.hk}

刊名：Carbon

出版年：2017

2.Restrain recombination by spraying pyrolysis TiO₂ on NiO film for quinoxaline-based p-type dye-sensitized solar cells

作者：Ying Yu^a ; Xing Li^a ; Zhongjin Shen^a ; Xiaoyu Zhang^a ; Peng Liu^b ; Yuting Gao^a ; Tao Jiang^a ; Jianli Hua^a ; ^{jlhua@ecust.edu.cn}

关键词：p-type DSSCs ; Quinoxaline ; Sensitizer ; TiO2 barrier layer

刊名：Journal of Colloid and Interface Science

出版年：2017

3.Transparent conducting ZnO-CdO mixed oxide thin films grown by the sol-gel method

作者：Trilok K. Pathak^a ; ^b ; ^{tpathak01@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; ^{PathakTK@ufs.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Jeevitesh K. Rajput^b ; Vinod Kumar^a ; ^c ; L.P. Purohit^b ; H.C. Swart^a ; R.E. Kroon^a ; ^{KroonRE@ufs.ac.za" class="auth_mail" title="E-mail the corresponding author}

关键词：Thin film ; Sol-gel ; X-ray diffraction ; Optical properties ; Electrical properties

刊名：Journal of Colloid and Interface Science

出版年：2017

4.In situ analysis of ion-induced polymer surface modification using secondary ion mass spectroscopy

作者：Shigeto Okuji^a ; ^b ; ^c ; ^{s-okuji@post.lintec.co.jp" class="auth_mail" title="E-mail the corresponding author} ; Hideaki Kitazawa^b ; Yoshihiko Takeda^b ; ^c ; ^{TAKEDA.Yoshihiko@nims.go.jp" class="auth_mail" title="E-mail the corresponding author}

关键词：Ion irradiation ; Surface modification ; ToF-SIMS ; Polyethylene ; Polytetrafluoroethylene ; Polyvinylidene difluoride

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

5.Secondary Ion Mass Spectrometry based depth profiling of Mo/Si interfaces with different microcrystalline structure

作者：Ch. Kishan Singh ; ^{kisn@igcar.gov.in" class="auth_mail" title="E-mail the corresponding author} ; S. Ilango ; S. Dash ; A.K. Tyagi

关键词：Thin films ; Interfaces ; Secondary ion mass spectroscopy ; Microstructure ; Sputtering

刊名：Materials Chemistry & Physics

出版年：2016

6.Lithium diffusion coefficient in amorphous lithium phosphate thin films measured by secondary ion mass spectroscopy with isotope exchange methods

作者：Naoaki Kuwata^a ; ^{kuwata@tagen.tohoku.ac.jp" class="auth_mail" title="E-mail the corresponding author} ; Xiaoli Lu^a ; Takamichi Miyazaki^b ; Yoshiki Iwai^a ; Tadao Tanabe^a ; Junichi Kawamura^a

关键词：Diffusion coefficient ; Thin-film battery ; Pulsed laser deposition ; Haven ratio

刊名：Solid State Ionics

出版年：2016

7.Shallow nitrogen ion implantation: Evolution of chemical state and defect structure in titanium

作者：P.A. Manojkumar^a ; ^{manoj@igcar.gov.in" class="auth_mail" title="E-mail the corresponding author} ; V.A. Chirayath^a ; A.K. Balamurugan^a ; Nanda Gopala Krishna^a ; S. Ilango^a ; M. Kamruddin^a ; G. Amarendra^a ; A.K. Tyagi^a ; Baldev Raj^b

关键词：Plasma Immersion Ion Implantation ; Secondary ion mass spectroscopy ; X-ray photo-electron spectroscopy ; Positron annihilation spectroscopy ; Point defect

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

8.Fast heavy-ion radiation damage of glycine in aqueous solution

作者：Shinji Nomura^a ; Hidetsugu Tsuchida^a ; ^b ; ^{tsuchida@nucleng.kyoto-u.ac.jp} ; Ryosuke Furuya^a ; Takuya Majima^a ; ^b ; Akio Itoh^a ; ^b

关键词：Radiation damage of biomolecules ; Radiolysis of aqueous solution ; Heavy-ion irradiation

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

9.Oxidation of nickel surfaces by low energy ion bombardment

作者：Iva Saric^a ; ^b ; Robert Peter^b ; ^c ; Ivna Kavre^b ; ^c ; Ivana Jelovica Badovinac^b ; ^c ; Mladen Petravic^b ; ^c ;

关键词：XPS ; Nickel oxide ; Ion-bombardment ; SIMS ; Thermal oxidation

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

10.Surface characterization of ZnO nanorods grown by chemical bath deposition

作者：C.M. Mbulanga^a ; ^{crispin.mbulanga@nmmu.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Z.N. Urgessa^a ; S.R. Tankio Djiokap^a ; J.R. Botha^a ; M.M. Duvenhage^b ; H.C. Swart^b

关键词：Zinc oxide (ZnO) ; Chemical bath deposition (CBD) ; Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) ; X-ray Photoelectron Spectroscopy (XPS) ; Auger Electron Spectroscopy (AES) ; Hydrogen diffusion

刊名：Physica B: Physics of Condensed Matter

出版年：2016

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