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在“Elsevier电子期刊”中，命中：18,092条，耗时：0.1519281 秒

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1.New hardware and workflows for semi-automated correlative cryo-fluorescence and cryo-electron microscopy/tomography

作者：Martin Schorb^a ; ^b ; Leander Gaechter^c ; Ori Avinoam^a ; Frank Sieckmann^d ; Mairi Clarke^a ; Cecilia Bebeacua^a ; ^e ; Yury S. Bykov^a ; Andreas F.-P. Sonnen^a ; ^f ; Reinhard Lihl^g ; John A.G. Briggs^a ; ^e ; ^f ; ^{john.briggs@embl.de}

关键词：CLEM ; correlative light and electron microscopy ; CEMOVIS ; cryo-electron microscopy of vitrified sections ; EM ; electron microscopy ; ET ; electron tomography ; FM ; fluorescence microscopy ; FOV ; field of view ; LN ; liquid nitrogen ; NA ; numerical aperture ; POI ; position(s) of interest ; TEM ; transmission electron microscopy ; WD ; working distance

刊名：Journal of Structural Biology

出版年：2017

2.Microstructure and properties of an as-deposited and heat treated martensitic stainless steel fabricated by direct laser deposition

作者：J.X. Fang^a ; ^{fangjx6@gmail.com} ; S.Y. Dong^b ; ^{syd422@sohu.com} ; Y.J. Wang^b ; B.S. Xu^b ; ^c ; Z.H. Zhang^b ; ^c ; D. Xia^b ; W.B. Ren^b ; P. He^c

关键词：Fe-Cr-Ni-B martensitic steel ; Microstructure ; Precipitation ; M23(C ; B)6 carboboride ; Direct laser deposition

刊名：Journal of Manufacturing Processes

出版年：2017

3.Optimized setup for integral refractive index direct determination applying digital holographic microscopy by reflection and transmission

作者：M. Fró ; meta^a ; G. Moreno^b ; J. Ricardo^a ; ^{jrperez@usp.br} ; Y. Arias^a ; M. Muramatsu^c ; L.F. Gomes^d ; G. Palá ; cios^a ; F. Palá ; cios^a ; H. Velá ; zquez^a ; J.L. Valin^e ; L. Ramirez Q^f

关键词：Digital Holographic Microscopy (DHM) ; Digital reconstruction ; Refractive index ; Erythrocyte

刊名：Optics Communications

出版年：2017

4.Assessing dolomite surface reactivity at temperatures from 40 to 120 °C by hydrothermal atomic force microscopy

作者：Ulf-Niklas Berninger^a ; ^b ; ^{berninger@get.obs-mip.fr} ; Giuseppe D. Saldi^a ; Guntram Jordan^b ; Jacques Schott^a ; Eric H. Oelkers^a ; ^c

关键词：Dolomite kinetics ; Hydrothermal atomic force microscopy ; Surface reactivity ; Template effect

刊名：Geochimica et Cosmochimica Acta

出版年：2017

5.Patenting medical diagnosis methods in Europe: Stanford University and time-lapse microscopy

作者：Sigrid Sterckx ; ^{sigrid.sterckx@ugent.be} ; Julian Cockbain ; Guido Pennings

关键词：diagnostic methods ; patenting in Europe ; time-lapse microscopy

刊名：Reproductive BioMedicine Online

出版年：2017

6.Quantitative interferometric microscopy with two dimensional Hilbert transform based phase retrieval method

作者：Shouyu Wang^a ; ^{wsy_photonics@yahoo.com" class="auth_mail" title="E-mail the corresponding author} ; Keding Yan^b ; Liang Xue^c ; ^{xueliangokay@gmail.com" class="auth_mail" title="E-mail the corresponding author}

关键词：Quantitative interferometric microscopy ; Two dimensional Hilbert transform ; Phase retrieval

刊名：Optics Communications

出版年：2017

7.Polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Piezoresponse Force Microscopy (PFM) techniques

作者：Juanxiu Xiao^a ; Tun Seng Herng^b ; Jun Ding^b ; Kaiyang Zeng^a ; ^{mpezk@nus.edu.sg" class="auth_mail" title="E-mail the corresponding author}

关键词：ZnO ; Cu thin films ; Piezoresponse Force Microscopy ; Polarization rotation ; Copper concentration ; Oxygen vacancy

刊名：Acta Materialia

出版年：2017

8.Acquisition of partial grain orientation information using optical microscopy

作者：Matteo Seita^a ; ^{matteo.seita@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; Michael M. Nimerfroh^a ; Michael J. Demkowicz^b

关键词：Optical microscopy ; Grain orientation mapping ; Quantitative metallography ; Numerical image analysis ; Polycrystalline metals

刊名：Acta Materialia

出版年：2017

9.On the spatial resolution limit of direct-write electron beam lithography

作者：Nan Jiang

关键词：Direct-write electron beam lithography ; Scanning transmission electron microscopy ; Electric field ; Spatial resolution

刊名：Microelectronic Engineering

出版年：2017

10.Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

作者：Praveen Kumar^a ; ^{praveen.kumar@uni-tuebingen.de} ; Michael Pfeffer^a ; Benjamin Willsch^a ; Oliver Eibl^a ; Lluí ; s Yedra^b ; Santhana Eswara^b ; Jean-Nicolas Audinot^b ; Tom Wirtz^b

关键词：Monocrystalline Si solar cells ; Dopants ; NanoSIMS ; Microstructure ; Contact resistance ; Structure-property relationship

刊名：Solar Energy Materials and Solar Cells

出版年：2017

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