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在“Elsevier电子期刊”中，命中：463条，耗时：0.0159911 秒

在所有数据库中总计命中：1,938条

1.Critical phases of viral production processes monitored by capacitance

作者：Emma Petiot^a ; ^b ; ^{emma.petiot@univ-lyon1.fr} ; Sven Ansorge^a ; ^{sven.ansorge@cnrc-nrc.gc.ca} ; Manuel Rosa-Calatrava^b ; ^{manuel.rosa-calatrava@univ-lyon1.frm} ; Amine Kamen^a ; ^c ; ^{amine.kamen@mcgill.ca}

关键词：On-line monitoring ; Capacitance probe ; Permittivity ; Characteristic frequency fc ; Virus production kinetics ; Dielectric cell properties ; Membrane capacitance ; Viral infection

刊名：Journal of Biotechnology

出版年：2017

2.Precision and accuracy of DFM soil water capacitance probes to measure temperature

作者：Nokhwezi Mjanyelwa ; Zaid A. Bello ; ^{belloz@ufs.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Willnerie Greaves ; Leon D. van Rensburg

关键词：Capacitance ; Temperature ; DFM probes ; Accuracy ; Precision

刊名：Computers and Electronics in Agriculture

出版年：2016

3.The electrochemical interface of Ag(111) in 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide ionic liquid—A combined in-situ scanning probe microscopy and impedance study

作者：Mian-Gang Li ; Li Chen ; Yun-Xin Zhong ; Zhao-Bin Chen ; Jia-Wei Yan ; ^{jwyan@xmu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Bing-Wei Mao ; ^{bwmao@xmu.edu.cn" class="auth_mail" title="E-mail the corresponding author}

关键词：Ionic liquid ; Double layer ; SPM ; Impedance ; Capacitance

刊名：Electrochimica Acta

出版年：2016

4.RNA-modified carbon nanotube arrays recognizing RNA via electrochemical capacitance response

作者：Ekaterina O. Fedorovskaya^a ; ^b ; Evgeny K. Apartsin^c ; ^{eka@niboch.nsc.ru" class="auth_mail" title="E-mail the corresponding author} ; Darya S. Novopashina^b ; ^c ; Alya G. Venyaminova^c ; Alexander G. Kurenya^a ; Lyubov G. Bulusheva^a ; ^b ; Alexander V. Okotrub^a ; ^b ; ^{spectrum@niic.nsc.ru" class="auth_mail" title="E-mail the corresponding author}

关键词：Carbon nanotubes ; Oligonucleotides ; Sensors ; Electrochemical capacitance ; Label-free detection

刊名：Materials & Design

出版年：2016

5.Dopant imaging of power semiconductor device cross sections

作者：U. Gysin^a ; ^{urs.gysin@unibas.ch" class="auth_mail" title="E-mail the corresponding author} ; E. Meyer^a ; ^{ernst.meyer@unibas.ch" class="auth_mail" title="E-mail the corresponding author} ; Th. Glatzel^a ; G. Gü ; nzburger^b ; H.R. Rossmann^c ; T.A. Jung^a ; ^c ; S. Reshanov^d ; A. Schö ; ner^d ; H. Bartolf^e

关键词：Dopant imaging ; Scanning Probe Microscopy (SPM) ; Power semiconductor devices ; Silicon carbide

刊名：Microelectronic Engineering

出版年：2016

6.Capacitive measuring system for two-phase flow monitoring. Part 1: Hardware design and evaluation

作者：Nikolas Libert^a ; Rigoberto E.M. Morales^b ; Marco Jose da Silva^a ; ^{mdasilva@utfpr.edu.br" class="auth_mail" title="E-mail the corresponding author}

关键词：Two-phase flow ; Void fraction ; Capacitive probe ; Microcontroller ; Capacitance measurement

刊名：Flow Measurement and Instrumentation

出版年：2016

7.Quantitative characterization of material surface — Application to Ni + Mo electrolytic composite coatings

作者：J. Kubisztal ; ^{julian.kubisztal@us.edu.pl} ; M. Kubisztal ; G. Haneczok

关键词：Surface roughness ; Power spectrum density ; Electrolytic composite coatings ; Scanning kelvin probe

刊名：Materials Characterization

出版年：2016

8.Thermal microscopy of electronic materials

作者：Ralf Heiderhoff ; ^{heiderho@uni-wuppertal.de" class="auth_mail" title="E-mail the corresponding author} ; Andreas Makris ; Thomas Riedl ; ^{triedl@uni-wuppertal.de" class="auth_mail" title="E-mail the corresponding author}

关键词：Thermal microscopy ; Failure analysis ; Reliability investigations ; Fault localization ; Heat transport ; Thermal conductivity ; Heat capacitance ; Thermos-elastic ; Phase transition ; Melting ; Glass transition ; Thermally induced strain ; Thermally induced stress ; Thermoelectric ; Thermography ; Thermometry ; Calorimetry ; SThM ; SJEM ; Laser beam techniques

刊名：Materials Science in Semiconductor Processing

出版年：2016

9.Structural and electrical characterization of CoNiO monolayer as copper diffusion barrier in integrated circuits

作者：S. Sharma^a ; ^{sumitelsd2007@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; M. Kumar^a ; ^b ; ^{kumarmukseh@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; S. Rani^a ; ^{sumitagarg2007@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; D. Kumar^a ; ^d ; ^{dineshelsd2014@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; C.C. Tripathi^c ; ^{tripathiuiet@gmail.com" class="auth_mail" title="E-mail the corresponding author}

关键词：Langmuir Blodgett technique ; Monolayer diffusion barrier ; Biased thermal stress ; XRD ; C‒V and leakage current characterization

刊名：Materials Science in Semiconductor Processing

出版年：2016

10.Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications

关键词：On-site radiation response ; Real-time I&ndash ; V/C&ndash ; V test ; High-κ dielectrics ; Total-dose induced defects ; HfO2

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

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