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在“Elsevier电子期刊”中，命中：2,596条，耗时：0.0209876 秒

在所有数据库中总计命中：4,619条

1.Depth profiling investigation by pARXPS and MEIS of advanced transistor technology gate stack

作者：L. Fauquier^a ; ^b ; ^c ; ^{laurent.fauquier@st.com} ; B. Pelissier^b ; ^c ; D. Jalabert^b ; ^d ; F. Pierre^b ; ^e ; R. Gassilloud^b ; ^e ; D. Doloy^a ; C. Beitia^b ; ^e ; T. Baron^b ; ^c

关键词：Depth profiling ; pARXPS ; MEIS ; HfON ; SiON ; HKMG

刊名：Microelectronic Engineering

出版年：2017

2.Identification of Chinese medicinal fungus Cordyceps sinensis by depth-profiling mid-infrared photoacoustic spectroscopy

作者：Changwen Du^a ; ^{chwdu@issas.ac.cn} ; Jianmin Zhou^a ; Jianfeng Liu^b

关键词：Cordyceps sinensis ; Photoacoutic spectroscopy ; Depth-profiling ; Principal component analysis ; Probabilistic neural network ; Identification

刊名：Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

出版年：2017

3.XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

关键词：XPS depth profiling ; Surface reactions ; Amine derivatization ; TFBA ; Plasma polymers

刊名：Applied Surface Science

出版年：2017

4.Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries

作者：S. Oswald ; ^{s.oswald@ifw-dresden.de} ; M. Hoffmann ; M. Zier

关键词：XPS ; Li-ion battery ; Energy reference ; Carbon anode material ; SEI

刊名：Applied Surface Science

出版年：2017

5.Optimization of the depth resolution for deuterium depth profiling up to large depths

作者：B. Wielunska ; ^{Barbara.Wielunska@ipp.mpg.de" class="auth_mail" title="E-mail the corresponding author} ; M. Mayer ; T. Schwarz-Selinger

关键词：Deuterium depth profiling ; Depth profiling ; Ion beam analysis ; D(3He ; p)4He ; Depth resolution ; Optimization of the depth resolution

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

6.Characterization of thin film tandem solar cells by radiofrequency pulsed glow discharge - Time of flight mass spectrometry

作者：Beatriz Fernandez^a ; ^{fernandezbeatriz@uniovi.es} ; Lara Lobo^a ; Nies Reininghaus^b ; Rosario Pereiro^a ; ^{mrpereiro@uniovi.es} ; Alfredo Sanz-Medel^a

关键词：Thin film solar cells ; Tandem-junctions solar cells ; Depth profiling analysis ; Glow discharge ; Time of flight mass spectrometry

刊名：Talanta

出版年：2017

7.Insights into low- to moderate-temperature recrystallization of zircon: Unpolished crystal depth profile techniques and geochemical mapping

作者：C.J. Kelly^a ; ^{ckell085@uottawa.ca} ; D.A. Schneider^a ; S.E. Jackson^b ; T. Kalbfleisch^a ; C.R. McFarlane^c

关键词：Zircon ; U-Pb geochronology ; Trace element geochemistry ; SIMS ; LA-ICP-MS ; Recrystallization

刊名：Chemical Geology

出版年：2017

8.Deep Diffusion of Phosphorus in Silicon using Microsecond-pulsed Laser Doping

作者：Som Mondal ; ^{s_mondal@iitb.ac.in} ; Chetan Singh Solanki ^{chetanss@iitb.ac.in}

关键词：Deep diffusion ; EBIC ; Junction depth ; Laser doping

刊名：Materials Science in Semiconductor Processing

出版年：2017

9.Spatial variability of E. coli in an urban salt-wedge estuary

作者：Dusan Jovanovic^a ; ^{dusan.jovanovic@monash.edu} ; Rhys Coleman^b ; ^{rhys.coleman@melbournewater.com.au} ; Ana Deletic^a ; ^{ana.deletic@monash.edu} ; David McCarthy^a ; ^{david.mccarthy@monash.edu}

关键词：Depth profiling ; Spatial distribution ; Faecal contamination ; Pathogens ; Stratified estuary

刊名：Marine Pollution Bulletin

出版年：2017

10.Quantitative depth profiling of Si_1-xGe_x structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry

作者：M.N. Drozdov^a ; ^b ; Y.N. Drozdov^a ; ^b ; A. Csik^c ; A.V. Novikov^a ; ^b ; K. Vad^c ; P.A. Yunin^a ; ^b ; D.V. Yurasov^a ; ^b ; S.F. Belykh^d ; G.P. Gololobov^e ; D.V. Suvorov^e ; A. Tolstogouzov^e ; ^f ; ^{a.tolstoguzov@fct.unl.pt" class="auth_mail" title="E-mail the corresponding author}

关键词：Electron-gas secondary neutral mass spectrometry (SNMS) ; Mixing-roughness-information depth model (MRI) ; Reference samples ; Si1&ndash ; xGex structures ; Sputter depth profiling ; Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

刊名：Thin Solid Films

出版年：2016

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