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在“Elsevier电子期刊”中，命中：40条，耗时：小于0.01 秒

1.MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

作者：T.F. Silva^a ; ^{tfsilva@if.usp.br" class="auth_mail" title="E-mail the corresponding author} ; C.L. Rodrigues^a ; M. Mayer^b ; M.V. Moro^a ; G.F. Trindade^a ; F.R. Aguirre^a ; N. Added^a ; M.A. Rizzutto^a ; M.H. Tabacniks^a

关键词：Self-consistent analysis ; Ion beam analysis ; Computer simulation ; SIMNRA ; MultiSIMNRA

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

2.Computer simulation of ion beam analysis of laterally inhomogeneous materials

作者：M. Mayer

关键词：Computer simulation ; Ion beam analysis ; Materials analysis ; Charged particle energy spectra ; SIMNRA

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

3.Analytical simulation of RBS spectra of nanowire samples

作者：Nuno P. Barradas^a ; ^{nunoni@ctn.ist.utl.pt" class="auth_mail" title="E-mail the corresponding author} ; C. Garcí ; a Nú ; ñ ; ez^b ; A. Redondo-Cubero^b ; ^c ; G. Shen^d ; P. Kung^d ; J.L. Pau^b

关键词：Simulation ; NDF ; RBS ; Nanowires ; ZnO

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

4.EBS/C proton spectra from a virgin diamond crystal

作者：M. Erich^a ; ^{marko.erich@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; M. Kokkoris^b ; S. Fazinić^c ; S. Petrović^a

关键词：EBS/C ; Dechanneling ; Diamond ; Carbon ; Computer simulation

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

5.Improved physics in SIMNRA 7

作者：M. Mayer ; ^{matej.mayer@ipp.mpg.de" class="auth_mail}

关键词：Computer simulation ; Ion beam analysis ; SIMNRA ; Rutherford backscattering ; Nuclear reaction analysis

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：1 August 2014

6.RBS depth profiling and optical characterization of multilayers of TiO₂ (20?nm) and Ge (15?nm)

作者：Mirza Sajjad Hussain^a ; Mazhar Mehmood^a ; ^{mazhar@pieas.edu.pk} ; Jamil Ahmad^a ; M. Tauseef Tanvir^a ; A. Faheem Khan^a ; Turab Ali^b ; Arshad Mahmood^c

关键词：Multilayers ; Rutherford ; backscattering spectroscopy (RBS) ; Interfaces ; Diffusion

刊名：Materials Chemistry and Physics

出版年：2013

7.In situ RBS measurements for the effect of swift heavy ion irradiation on metal-insulator interfaces

作者：M. Hayashi ; M. Matsuda ; T. Asozu ; M. Sataka ; M. Nakamura ; A. Iwase

关键词：In situ RBS ; Atomic mixing ; Electronic excitation ; Metal&ndash ; insulator interfaces ; Swift heavy ions

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2013

8.Layer morphology analysis of sputter-eroded silicon gratings using Rutherford backscattering

作者：Hagen Langhuth^a ; Matej Mayer ; ^a ; ^{Matej.Mayer@ipp.mpg.de"" rel=""nofollow} ; Stefan Lindig^a

关键词：Surface morphology ; In situ RBS ; SIMNRA

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2011

9.Depth profiling of high energy nitrogen ions implanted in the ? 0 0? ? 1 0?and randomly oriented silicon crystals

作者：M. Eri?^a ; ^{marko.erich@gmail.com} ; S. Petrovi?^a ; M. Kokkoris^b ; A. Lagoyannis^c ; V. Paneta^c ; S. Harissopulos^c ; I. Tele?ki^a

关键词：Channeling implantation ; Nuclear Reaction Analysis ; RBS/C ; Silicon amorphization

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2012

10.Rutherford backscattering analysis of porous thin TiO₂ films

作者：M. Mayer^a ; ^{Matej.Mayer@ipp.mpg.de} ; U. von Toussaint^a ; J. Dewalque^b ; O. Dubreuil^b ; C. Henrist^b ; R. Cloots^b ; F. Mathis^c

关键词：Computer software ; Data analysis ; Simulation ; Ion beam analysis ; Porous materials

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2012

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