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在“Elsevier电子期刊”中，命中：11条，耗时：0.0639667 秒

在所有数据库中总计命中：204条

1.Single event double node upset tolerance in MOS/spintronic sequential and combinational logic circuits

作者：Ramin Rajaei ^{r_rajaei@sbu.ac.ir}

关键词：STT-MRAM ; Magnetic tunnel junction (MTJ) ; Nonvolatility ; Radiation immunity ; Soft error ; Single event upset (SEU) ; Single event double node upset (SEDU)

刊名：Microelectronics Reliability

出版年：2017

2.DIRT latch: A novel low cost double node upset tolerant latch

作者：Nikolaos Eftaxiopoulos ; ^{eftaxiopoulos@microlab.ntua.gr} ; Nicholas Axelos ^{njaxel@microlab.ntua.gr} ; Kiamal Pekmestzi ^{pekmes@microlab.ntua.gr}

关键词：Radiation tolerance ; Soft error tolerant latch ; Charge sharing ; Single node upset ; Double node upset

刊名：Microelectronics Reliability

出版年：2017

3.A low power-delay-product and robust Isolated-DICE based SEU-tolerant latch circuit design

作者：I-Chyn Wey ; Yu-Sheng Yang ; Bin-Cheng Wu ; Chien-Chang Peng

关键词：Soft error ; Single event upset ; Isolating ; DICE ; Latch

刊名：Microelectronics Journal

出版年：January, 2014

4.Single event upset mitigation techniques for FPGAs utilized in nuclear power plant digital instrumentation and control

作者：Xin Wang^a ; ^{xwang3@bjtu.edu.cn"" rel=""nofollow} ; Keith E. Holbert^b ; ^{holbert@asu.edu"" rel=""nofollow} ; ^{keith.holbert@asu.edu"" rel=""nofollow} ; Lawrence T. Clark^b ; ^{Lawrence.Clark@asu.edu"" rel=""nofollow}

刊名：Nuclear Engineering and Design

出版年：2011

5.Swift heavy ion induced single event upsets in high density UV-EPROM’s

作者：S.S. Dahiwale ; N.S. Shinde ; D. Kanjilal ; V.N. Bhoraskar ; S.D. Dhole

关键词：SEU ; UV-EPROM ; LET ; Ion irradiation

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2008

6.A proposed DG-FinFET based SRAM cell design with RadHard capabilities

作者：S.S. Rathod ; A.K. Saxena ; S. Dasgupta

刊名：Microelectronics Reliability

出版年：2010

7.Neutron-induced soft error rate measurements in semiconductor memories

作者：Kenan Ü ; nlü ; Vijaykrishnan Narayanan ; Sacit M. Ç ; etiner ; Vijay Degalahal ; Mary J. Irwin

关键词：Soft error ; Single-event upset ; SEU ; Soft error rate (SER) ; Accelerated soft error testing ; Neutron ; Nuclear research reactor

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2007

8.Designing CMOS data cells for space systems

作者：Rockett ; Leonard R.

关键词：Complementary metal oxide semiconductor ; Single-event upset ; Linear energy transfer

刊名：Microelectronics Journal

出版年：2004

9.Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems

作者：J.L. Leray

关键词：Adaptive search space ; Genetic algorithms ; Hysteresis identification ; Actuator hysteresis compensation

刊名：Microelectronics Reliability

出版年：2007

10.An example of what you can miss in single-event-effect testing, when you do not have a microprobe

作者：Fischer ; B.E. ; Schlö ; gl ; M. ; Barak ; J. ; Adler ; E. ; Metzger ; S.

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：1999

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