作者：Harry van der Graaf^a ; ^b ; ^{vdgraaf@nikhef.nl} ; Hassan Akhtar^a ; Neil Budko^a ; Hong Wah Chan^a ; Cornelis W. Hagen^a ; Conny C.T. Hansson^a ; ^b ; Gert Nü ; tzel^d ; Serge D. Pinto^d ; Violeta Prodanović^a ; Behrouz Raftari^a ; Pasqualina M. Sarro^a ; John Sinsheimer^c ; John Smedley^c ; Shuxia Tao^e ; Anne M.M.G. Theulings^a ; ^b ; Kees Vuik^a

关键词：ALD ; atomic layer deposition ; BSE ; back scatter electrons ; CBM ; conduction band minimum ; CMOS ; complementary metal oxide semiconductor ; DFC ; Dual Faraday Cup ; EA ; electron affinity ; FSE ; forward scattered electrons ; GEANT ; Geometry and Tracking ; MEMS ; Micro Electronic Mechanical Systems ; NEA ; negative electron affinity ; PE ; primary electron ; SEE ; secondary electron emission ; SEY ; secondary electron yield ; RSE ; reflective secondary electrons ; RSEY ; reflective secondary electron yield ; SEM ; scanni

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2017

作者：Lydia-Marie Joubert^a ; ^{lydiaj@stanford.edu} ; Jose AG Ferreira^b ; ^c ; ¹ ; David A Stevens^b ; ^c ; Hasan Nazik^b ; ^c ; ² ; Lynette Cegelski^d

关键词：BSE ; Backscattered Electron ; CF ; cystic fibrosis ; CPD ; critical point drying ; ECM ; extracellular matrix ; EPS ; extracellular polymeric substances ; ET ; Everhart-Thornley ; FESEM ; Field Emission Scanning Electron Microscopy ; GA ; glutaraldehyde ; HMDS ; hexamethyldisilazane ; NMR ; Nuclear Magnetic Resonance ; OsO4 ; osmium tetroxide ; PBS ; phosphate-buffered saline ; PFA ; paraformaldehyde ; SE ; Secondary Electron ; SEM ; Scanning Electron Microscopy ; SNR ; Signal to Noise Ratio ; VP-SEM ; Variable Pressure-SEM

刊名：Journal of Microbiological Methods

出版年：2017

作者：S.B. Rakesh Chandran^a ; ^b ; ^{rakwin@gmail.com} ; S.R. Rajesh^a ; ^{sivayaohm@gmail.com} ; A. Abraham^c ; ^b ; ^{isureshabraham@gmail.com} ; G. Renuka^d ; ^{drgrenuka@gmail.com} ; Chandu Venugopal^e ; ^{cvmgphys@yahoo.co.in}

关键词：SEP events ; Lunar dust charging ; Lunar surface charging ; Secondary electron yield ; Dust levitation

刊名：Advances in Space Research

出版年：2017

作者：A. Di Piazza^a ; ^{dipiazza@mpi-hd.mpg.de} ; Tobias N. Wistisen^b ; Ulrik I. Uggerhø ; j^b

关键词：Radiation reaction ; Landau&ndash ; Lifshitz equation ; Channeling radiation in crystals

刊名：Physics Letters B

出版年：2017

作者：Bai-Peng Song^a ; Run-Dong Zhou^a ; Guo-Qiang Su^a ; Hai-Bao Mu^a ; ^{haibaomu@xjtu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Guan-Jun Zhang^a ; ^{gjzhang@xjtu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Ren-An Bu^b

关键词：Secondary electron emission ; Trapped charges accumulation ; Capture cross section

刊名：Applied Surface Science

出版年：2016

作者：Trilok K. Pathak^a ; ^b ; ^{tpathak01@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; ^{PathakTK@ufs.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Jeevitesh K. Rajput^b ; Vinod Kumar^a ; ^c ; L.P. Purohit^b ; H.C. Swart^a ; R.E. Kroon^a ; ^{KroonRE@ufs.ac.za" class="auth_mail" title="E-mail the corresponding author}

关键词：Thin film ; Sol-gel ; X-ray diffraction ; Optical properties ; Electrical properties

刊名：Journal of Colloid and Interface Science

出版年：2017

作者：Fanbin Meng ; Xueni Shang ; Wei Zhang ; ^{wzhang@hebut.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Yujie Zhang

关键词：Nickel ferrite ; Indium substitution ; Structural properties ; Magnetism

刊名：Physica B: Physics of Condensed Matter

出版年：2017

作者：E.I. Rau^a ; ^{rau@phys.msu.ru" class="auth_mail" title="E-mail the corresponding author} ; A.A. Tatarintsev^b ; V.V. Khvostov^a ; V.E. Yurasova^a

关键词：Charging of dielectrics ; Sapphire ; Secondary electron emission ; Ion bombardment ; Surface potential

刊名：Vacuum

出版年：2016

作者：Xiao-Chuan Hu^a ; ^b ; ^{huxc@chd.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Meng Cao^b ; Wan-Zhao Cui^c

关键词：Secondary electron yield ; Surface topography ; Electron impact ; Ar-ion bombardment ; Copper sample

刊名：Micron

出版年：2016

作者：Krzysztof P. Grzelakowski ^{k.grzelakowski@opticon-nanotechnology.com" class="auth_mail" title="E-mail the corresponding author}

关键词：Electron spectromicroscopy ; XPEEM ; EF-PEEM ; Imaging AES ; LEEM ; DEEM ; EELS ; Imaging EELS ; Imaging ESCA ; Momentum mapping ; Momentum microscopy

刊名：Ultramicroscopy

出版年：2016