文摘
Accelerated life tests are frequently used to provide reliability information in a moderate period of time (weeks or months), and after that, a failure analysis is compulsory to detect the failure origins. In this paper, a failure analysis has been carried out after a temperature accelerated life test on lattice matched GaInP/Ga(In)As/Ge triple junction commercial solar cells. Solar cells were forward biased in darkness inside three climatic chambers in order to emulate the photo-generated current under nominal working conditions (a concentration level of 820 suns). After the accelerated aging test, a characterization of the resulting cells by means of quantum efficiency, dark and illumination I–V curves, electroluminescence, scanning electron microscope, energy dispersive X-ray, scanning transmission electron microscope and X-ray photoelectron spectroscopy has been carried out.
