Bandgap imaging in Cu(In,Ga)Se₂ photovoltaic modules by electroluminescence

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• 作者：Matevž Bokalič ; Bart E. Pieters ; Andreas Gerber ; Uwe Rau and Marko Topič
• 刊名：Progress in Photovoltaics: Research and Applications
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：25
• 期：2
• 页码：184-191
• 全文大小：1069K
• ISSN：1099-159X

文摘

A unique non-destructive characterization method for apparent bandgap imaging in photovoltaic (PV) devices based on acquisition of two electroluminescence (EL) images in different spectral ranges is presented. The method consists of a calibration procedure and a bandgap imaging procedure. Calibration has to be performed once per module type and EL imaging setup, and must provide a relation between the bandgap and the ratio between two spectrally independent EL images. After calibration, bandgap imaging only requires acquisition of two spectrally independent EL images followed by image processing, making the method very fast and suitable for in-line PV module characterization with regard to spatial (in)homogeneity and production process stability. The method is demonstrated on a commercial state-of-the-art Cu(In,Ga)Se₂ PV module where apparent bandgap fluctuations between 1.07 and 1.15 eV are detected. Copyright