Readout schemes for low noise single-photon avalanche diodes fabricated in conventional HV-CMOS technologies

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• 作者：E. Vilella ; A. Di¨¦guez
• 关键词：Single-photon avalanche diode (SPAD) ; Afterpulsing ; CMOS ; Dark count ; Gated operation ; Low noise ; Pixel
• 刊名：Microelectronics Journal
• 出版年：2013
• 出版时间：October, 2013
• 年：2013
• 卷：44
• 期：10
• 页码：941-947
• 全文大小：1472 K

文摘

Three different pixels based on single-photon avalanche diodes for triggered applications, such as fluorescence lifetime measurements and high energy physics experiments, are presented. Each pixel consists of a 20 ¦Ìm¡Á100 ¦Ìm (width¡Álength) single photon avalanche diode and a monolithically integrated readout circuit. The sensors are operated in the gated mode of acquisition to reduce the probability to detect noise counts interferring with real radiation events. Each pixel includes a different readout circuit that allows to use low reverse bias overvoltages. Experimental results demonstrate that the three pixels present a similar behavior. The pixels get rid of afterpulses and present a reduced dark count probability by applying the gated operation. Noise figures are further improved by using low reverse bias overvoltages. The detectors exhibit an input dynamic range of 13.35 bits with short gated ¡®on¡¯ periods of 10 ns and a reverse bias overvoltage of 0.5 V. The three pixels have been fabricated in a standard HV-CMOS process.