Thermal behaviour below and inside the glass transition region of a submicron P3HT layer studied by fast scanning chip calorimetry
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文摘

Submicron P3HT and PBT layers on gold foil were investigated by chip calorimetry.

Isothermal studies inside/below Tg were performed while scanning at 30 000 K s−1.

An important influence of the glass phase on crystallization is observed.

For P3HT imperfect crystals are formed that undergo isothermal perfectioning.

PBT reorders during heating, forming much more stable crystals.

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