刊名:International Journal of Heat and Mass Transfer
出版年:2017
出版时间:January 2017
年:2017
卷:104
期:Complete
页码:871-877
全文大小:1902 K
文摘
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Interfacial thermal resistance (R) of phosphorene/silicon was modeled by MD.
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Interaction among phosphorene atoms was modeled by the Stillinger–Weber potential.
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R of phosphorene/silicon decreases with system temperature and coupling strength.
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R of phosphorene/silicon is about a quarter of that of graphene/silicon.
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R for phosphorene is more sensitive to external variations than that for silicene.
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