Molecular dynamics simulation of the interfacial thermal resistance between phosphorene and silicon substrate
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Interfacial thermal resistance (R) of phosphorene/silicon was modeled by MD.

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Interaction among phosphorene atoms was modeled by the Stillinger–Weber potential.

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R of phosphorene/silicon decreases with system temperature and coupling strength.

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R of phosphorene/silicon is about a quarter of that of graphene/silicon.

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R for phosphorene is more sensitive to external variations than that for silicene.

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