设为首页
Trans-crystalline fatigue crack growth in CMSX-4 micro-beam implemented.
Dislocation pile-up causes crack deceleration at the neutral axis of a micro-beam.
Bauschinger effect resulting from a dislocation pile-up during micro-beam fatigue.
Crack growth curve gathered by combination of FEM-simulations and experiment.
Fatigue crack growth in micro-beams needs higher stress intensity factor ranges.