Experimental Determination of Deformation Induced Lattice Rotation by EBSD Technique for Slip System Analysis

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• 作者：Xuehao Zheng¹ ; Hongwang Zhang¹ ; ² ; ^{hwzhang@imr.ac.cn}
• 关键词：Lattice rotation ; Electron backscatter diffraction ; Slip system ; Deformation
• 刊名：Journal of Materials Science & Technology
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：33
• 期：1
• 页码：90-98
• 全文大小：3351 K
• 卷排序：33

文摘

A method was proposed to experimentally determine the deformation induced lattice rotation by electron backscatter diffraction (EBSD) technique, based on which the activated slip systems could be predicted. The method is to create a project file including the EBSD data of the sample before and after deformation, which allows the lattice rotation to be calculated and visualized using the commercial EBSD software. This method was applied to a polycrystalline Ni subjected to quasi-static compression. The lattice rotation of one grain was calculated and visualized and the activated slip systems were predicted. The comparison with the slip systems predicted by full-constraints (FC) Taylor model highlights the advantage of the present method.