Image analysis of single event transient effects on charge coupled devices irradiated by protons

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• 作者：Zujun Wang^a ; ^{wangzujun@nint.ac.cn" class="auth_mail" title="E-mail the corresponding author} ; Yuanyuan Xue^a ; Jing Liu^b ; Baoping He^a ; Zhibin Yao^a ; Wuying Ma^a
• 关键词：Charge-coupled devices (CCD) ; Single event transient (SET) effects ; Displacement damage (DD) effects ; Proton radiation ; Dark signal spike
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2016
• 出版时间：21 October 2016
• 年：2016
• 卷：834
• 期：Complete
• 页码：118-122
• 全文大小：706 K

文摘

The experiments of single event transient (SET) effects on charge coupled devices (CCDs) irradiated by protons are presented. The radiation experiments have been carried out at the accelerator protons with the energy of 200 MeV and 60 MeV.The incident angles of the protons are at 30°and 90° to the plane of the CCDs to obtain the images induced by the perpendicularity and incline incident angles. The experimental results show that the typical characteristics of the SET effects on a CCD induced by protons are the generation of a large number of dark signal spikes (hot pixels) which are randomly distributed in the “pepper” images. The characteristics of SET effects are investigated by observing the same imaging area at different time during proton radiation to verify the transient effects. The experiment results also show that the number of dark signal spikes increases with increasing integration time during proton radiation. The CCDs were tested at on-line and off-line to distinguish the radiation damage induced by the SET effects or DD effects. The mechanisms of the dark signal spike generation induced by the SET effects and the DD effects are demonstrated respectively.