Searching for optimal setting conditions in technological processes using parametric estimation models and neural network mapping approach: A tutorial
详细信息    查看全文
文摘

The concept of parametric estimation model was compared with neural network approach.

DOE for solder past printing and production of cheese was discussed.

We have got the similar results using both methods.

NGLC 2004-2010.National Geological Library of China All Rights Reserved.
Add:29 Xueyuan Rd,Haidian District,Beijing,PRC. Mail Add: 8324 mailbox 100083
For exchange or info please contact us via email.