Atomic scale characterization of white etching area and its adjacent matrix in a martensitic 100Cr6 bearing steel

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• 作者：Y.J. Li^a ; ^b ; ^y.li@mpie.de ; ^{yujiao.li@rub.de} ; M. Herbig^a ; S. Goto^a ; D. Raabe^a ; ^{d.raabe@mpie.de}
• 关键词：Severe plastic deformation ; Grain boundary segregation ; Carbide dissolution ; Nanocrystalline structure ; Rolling contact fatigue
• 刊名：Materials Characterization
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：123
• 期：Complete
• 页码：349-353
• 全文大小：1725 K
• 卷排序：123

文摘

APT has been applied to characterize the microstructure of white etching area (WEA). Quantitative analyses of C distribution indicate that carbides are dissolved on the WEA. WEA contains equiaxed grains with a uniform grain size of 10 nm. C segregation at grain boundaries stabilizes the nanosized grain structure. Formation of WEA is explained by severe local plastic deformation introduced by cyclic contact loading.