Effects of Seidel aberration and light polarization on the resolution of STED imaging

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• 作者：Xiaogang Chen ; Jianling Chen ; Shiqing Dong ; Hongqin Yang ; ^{hqyang@fjnu.edu.cn} ; Shusen Xie ; ^{ssxie@fjnu.edu.cn}
• 关键词：Depletion pattern ; Seidel aberration ; Light polarization ; STED microscopy ; Resolution
• 刊名：Optik - International Journal for Light and Electron Optics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：130
• 期：Complete
• 页码：76-81
• 全文大小：1138 K
• 卷排序：130

文摘

The aberrations in microscope system and polarization of the input light beam directly determine the quality of the depletion patterns, which mainly affect the resolution improvement of Stimulated Emission Depletion (STED) microscopy. In the paper, the influences of combining Seidel aberrations and light polarization on the depletion patterns were analyzed comprehensively. And a comparative study about the effects on the resolution was conducted. Simulation results show that the right-handed circularly polarization is the best choice for the depletion patterns in the same condition. And the serious aberration will influence the realization of super-resolution. This study could provide a reliable theoretical basis for a realization of a STED super-resolution system with less aberration.