Influence of resonant Raman scattering in the elemental analysis using X-ray emission based techniques

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• 作者：Sunil Kumar ; Gurjeet Singh ; Sanjeev Kumar ; D. Mehta ; Nirmal Singh
• 关键词：Characteristic X-ray ; Resonant Raman scattering ; X-ray attenuation coefficients ; Photon- and particle-induced X-ray spectrometry
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2010
• 出版时间：1 August 2010
• 年：2010
• 卷：268
• 期：15
• 页码：2437-2445
• 全文大小：675 K

文摘

A tabulation of characteristic X-ray energies across the periodic table are provided where those X-rays are expected to result in a significant fractional resonant Raman scattering (RRS) contribution to the X-ray attenuation from a particular shell/subshell of the same or another element. The tabulations can be considered as guideline so as to know what can be expected due to RRS in typical photon- and particle-induced X-ray emission spectrometry. The RRS contribution is not included in the available theoretical attenuation coefficients, which are generally used in estimation of the matrix corrections in routine quantitative elemental analysis based on various X-ray emission techniques. The radiative RRS peaks can also interfere with normal X-ray spectrum and influence the elemental analysis. The RRS cross-section depends upon the energy difference of the X-ray energy and the shell/subshell ionization threshold taken in the units of the shell/subshell energy width, density of available states near the Fermi level, and the band structure in case the element is in the solid form. Some aspects of the dependence of the RRS contribution on the chemical forms of the elements are also discussed.