Temperature evolution of structural and electrical property for Sr₇Mn₄O₁₅ at high temperature

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• 作者：X.M. Yang^a ; Weimei Xie^a ; X.M. Gu^a ; G.T. Zhou^a ; Kai Lv^a ; G.F. Cheng^b ; ^{gfcheng@mail.sic.sc.cn} ; A.M. Zhang^c ; F.M. Zhang^a ; X.S. Wu^a ; ^{xswu@nju.edu.cn}
• 关键词：Sr7Mn4O15 ceramic ; in-situ X-ray diffraction ; Electronic transport property ; Negative Temperature Coefficient (NTC) Thermistor ceramics
• 刊名：Journal of Alloys and Compounds
• 出版年：2017
• 出版时间：30 March 2017
• 年：2017
• 卷：699
• 期：Complete
• 页码：230-234
• 全文大小：1320 K
• 卷排序：699

文摘

Temperature evolution on structure for Sr7Mn4O15 has been studied by the in-situ X-ray diffraction at high temperature. Thermal lattice expansion leads to the band-gap shrinkage of Sr7Mn4O15 verified by the first principle calculation. Sr7Mn4O15 ceramic resistor is very sensitive to temperature with excellent application value in NTC.