Negative thermal quenching of the 3.338 eV emission in ZnO nanorods

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• 作者：Kewei Wu ; Haiping He ; Yangfan Lu ; Jingyun Huang ; Zhizhen Ye
• 关键词：A. Nanostructures ; A. Semiconductors ; D. Photoluminescence
• 刊名：Solid State Communications
• 出版年：2012
• 出版时间：September, 2012
• 年：2012
• 卷：152
• 期：18
• 页码：1757-1760
• 全文大小：848 K

文摘

We investigate the negative thermal quenching behavior of the 3.338 eV emission in ZnO nanorods. A correlation between the 3.338 eV and the 3.368 eV (surface exciton) emissions is determined from temperature-dependent photoluminescence. The activation energies of the 3.338 eV emission, obtained using an approximated multi-level model, indicate an trap state between the two surface exciton emissions. The present study demonstrates a nondestructive and easy method to understand the surface effects on the optical properties of semiconductor nanostructures.