Second-order analysis for thin structures

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• 作者：Santos ; Pedro Miguel ; Zappale ; Elvira
• 关键词：26A16 ; 26A51 ; 35E99 ; 35M10 ; 74B20 ; 74K15 ; 74K20 ; 74K35 ; Dimension reduction ; Thin films ; Γ ; -convergence ; Relaxation ; A-quasiconvexity ; Lipschitz continuity
• 刊名：Nonlinear Analysis
• 出版年：2004
• 出版时间：February, 2004
• 年：2004
• 卷：56
• 期：5
• 页码：679-713
• 全文大小：428 K

文摘

The effective behavior of second-order strain energy densities is obtained using relaxation and Γ-convergence techniques. The Cosserat theory is recovered within a dimension reduction analysis for 3D thin domains with varying profiles. Homogeneous and inhomogeneous 2D models with periodic profiles are treated.