Evaporating thin film profile near the contact line of a partially wetting water droplet under environmental heating

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• 作者：Abbasali Abouei Mehrizi ; Hao Wang ; ^{hwang@coe.pku.edu.cn}
• 关键词：Partial wetting ; Nanoscale morphology ; Receding ; Droplet evaporation ; Contact line ; Thin film ; AFM
• 刊名：International Journal of Heat and Mass Transfer
• 出版年：2017
• 出版时间：April 2017
• 年：2017
• 卷：107
• 期：Complete
• 页码：1-5
• 全文大小：837 K
• 卷排序：107

文摘

Nanoscale thin film profile of an evaporating droplet near contact line is studied. To measure profile, state-of-the-art tapping-mode atomic force microscopy is used. The water surface is found straight downward to the substrate. The microscopic (nanoscale) and macroscopic contact angles are approximately equal.