A service interruption free testing methodology for IEDs in IEC 61850-based substation automation systems

详细信息    查看全文

• 作者：Seongil Lim ^{slim@kyungnam.ac.kr}
• 关键词：IEC 61850 ; Intelligent electronic devices (IEDs) testing ; Substation configuration language (SCL)-based engineering ; Service interruption ; Service reliability ; Substation automation systems (SAS)
• 刊名：International Journal of Electrical Power & Energy Systems
• 出版年：2017
• 出版时间：May 2017
• 年：2017
• 卷：87
• 期：Complete
• 页码：65-76
• 全文大小：2810 K
• 卷排序：87

文摘

A methodology for testing IEDs in IEC 61850-based substations has been proposed. Proposed methodology ensures service continuity during testing process. Proposed testing methodology is valid for IEC 61850-based IEDs of different vendors. Proposed testing method is applicable for function and device testing, diagnosis, and troubleshooting.