Effect of a dislocation pile-up at the neutral axis on trans-crystalline crack growth for micro-bending fatigue
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Trans-crystalline fatigue crack growth in CMSX-4 micro-beam implemented.

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Dislocation pile-up causes crack deceleration at the neutral axis of a micro-beam.

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Bauschinger effect resulting from a dislocation pile-up during micro-beam fatigue.

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Crack growth curve gathered by combination of FEM-simulations and experiment.

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Fatigue crack growth in micro-beams needs higher stress intensity factor ranges.

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