Single-shot electro-optic experiments for electron bunch diagnostics at Tsinghua Accelerator Laboratory

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• 作者：Wei Wang^a ; ^b ; Yingchao Du^a ; ^b ; Lixin Yan^a ; ^b ; Jianfei Hua^a ; ^b ; Zhen Zhang^a ; ^b ; Zheng Zhou^a ; ^b ; Wenhui Huang^a ; ^b ; ^{huangwh@mail.tsinghua.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Chuanxiang Tang^a ; ^b ; Ming Li^c
• 关键词：Longitudinal bunch profile ; Electro-optic ; Spectral decoding ; Single-shot ; Non-destructive monitor ; Arrival time
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2016
• 出版时间：21 October 2016
• 年：2016
• 卷：834
• 期：Complete
• 页码：183-186
• 全文大小：919 K

文摘

The electro-optic (EO) technique detects the Coulomb electric field distribution of relativistic electron bunches to obtain the associated longitudinal profile. This diagnostic method allows the direct time-resolved single-shot measurement and thus the real-time monitoring of the bunch profile and beam arrival time in a non-destructive way with sub-picosecond temporal resolution. In this paper, we report the measurement of the longitudinal profile of an electron bunch through electro-optic spectral decoding detection, in which the bunch profile is encoded into the spectra of the linearly chirped laser pulse. The experimental setup and measurement results of a 40 MeV electron bunch are presented, with a temporal profile length of 527 fs rms (~1.24 ps FWHM) and a beam arrival time jitter of 471 fs rms. Temporal resolution and future experimental improvement are also discussed.