Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging

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• 作者：Oluwadamilola O. Taiwo^a ; Juan M. Paz-Garcí ; a^b ; Stephen A. Hall^b ; Thomas M.M. Heenan^a ; Donal P. Finegan^a ; Rajmund Mokso^c ; Pablo Villanueva-Pé ; rez^c ; Alessandra Patera^c ; ^d ; Daniel J.L. Brett^a ; Paul R. Shearing^a ; ^{p.shearing@ucl.ac.uk}
• 关键词：X-ray CT ; Silicon electrode ; Lithiation ; Particle fracturing ; Degradation
• 刊名：Journal of Power Sources
• 出版年：2017
• 出版时间：28 February 2017
• 年：2017
• 卷：342
• 期：Complete
• 页码：904-912
• 全文大小：2740 K
• 卷排序：342

文摘

Si particle evolution in early stage of lithiation was captured using X-ray CT. Fracturing of Si particles during incremental lithiation was visualised. Lithiation-induced micro-cracks propagate within particles leading to fracturing. Si particle lithiation as a function of distance from current collector was studied.