New members of MOF-76 family containing Ho(III) and Tm(III) ions: Characterization, stability and gas adsorption properties

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New members of MOF-76 family containing Ho(III) and Tm(III) ions: Characterization, stability and gas adsorption properties

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作者：M. Almá ; &scaron ; i^a ; V. Zeleňá ; k^a ; ^{vladimir.zelenak@upjs.sk" class="auth_mail" title="E-mail the corresponding author} ; J. Kuchá ; r^a ; S. Bourrelly^b ; P.L. Llewellyn^b
关键词：MOF-76 ; Crystal structures ; Framework stability ; High energy powder X-ray diffraction ; Adsorption properties
刊名：Colloids and Surfaces A: Physicochemical and Engineering Aspects
出版年：2016
出版时间：5 May 2016
年：2016
卷：496
期：Complete
页码：114-124
全文大小：3439 K

文摘

•: Two new metal-organic frameworks of MOF-76 family were prepared and studied.
•: Both frameworks exhibit the open porosity and high thermal stability.
•: Tm(III) compound shows “single-crystal-to-single-crystal transformation”.
•: High pressure adsorption of CO₂ is 2–3 times higher in comparison with CH₄ and N₂.

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