XPS studies of perovskites surface instability caused by Ar⁺ ion and electron bombardment and metal deposition

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• 作者：Bronisł ; aw Psiuk ; Jacek Szade ; Michał ; Pilch ; Krzysztof Szot
• 关键词：SrTiO₃ ; Photoemission spectroscopy ; Electron irradiation ; Ion bombardment ; Metal deposition ; Perovskite surface ; Electroreduction ; Interface
• 刊名：Vacuum
• 出版年：2009
• 出版时间：1 May 2009
• 年：2009
• 卷：83
• 期：Supplement 1
• 页码：S69-S72
• 全文大小：350 K

文摘

X-ray Photoelectron Spectroscopy (XPS) was used to study the influence of low energy Ar⁺ ion bombardment, electron bombardment and Pt deposition on the SrTiO₃ (STO) single crystal electronic structure. Atomic composition changes were found and attributed to chemical reconstruction of the STO surface. A clear correlation between the presence of conducting, low Ti oxidation states in valence band and core level changes was detected. A strong effect caused by electron irradiation was ascribed to the electroreduction process. The influence of lanthanum doping on surface instability of STO was also discussed. The La doped sample (STO: 3,75 % La) was found to be modified upon Pt metal deposition to a higher degree than pure STO crystal.