Reversed texture in nanometric carbon/boron nitride multilayers

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• 作者：R. Torres^a ; b ; I. Caretti^a ; V. Serin^b ; ^{serin@cemes.fr" class="auth_mail} ; N. Brun^c ; G. Radn&oacute ; czic^d ; I. Jimé ; nez^a
• 刊名：Carbon
• 出版年：August 2014
• 年：2014
• 卷：74
• 期：Complete
• 页码：374-378
• 全文大小：2190 K

文摘

A structure-controlled series of carbon/boron nitride multilayers, with bilayer thicknesses from 1.25 to 160 nm has been grown by sequential evaporation of carbon and boron assisted with nitrogen ions. The minimum bilayer thickness for a stable stack is 2.9 nm. A turbostratic texture of the carbon and BN phases is evidenced even for small periods of the bilayers. Interestingly, BN and C basal planes of adjacent sub-layers exhibit perpendicular alignment between them: along the growth direction for h-BN rich layers, and parallel to the surface for the C rich ones.