Quality control method based on photoluminescence imaging for the performance prediction of c-Si/a-Si:H heterojunction solar cells in industrial production lines

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Quality control method based on photoluminescence imaging for the performance prediction of c-Si/a-Si:H heterojunction solar cells in industrial production lines

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作者：O. Nos^a ; ^{oriol.nos@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; W. Favre^a ; F. Jay^a ; F. Ozanne^a ; A. Valla^a ; J. Alvarez^b ; D. Muñ ; oz^a ; P.J. Ribeyron^a
关键词：Photoluminescence imaging ; Silicon solar cells ; Heterojunction solar cells ; Saw marks ; Defects ; Quality control
刊名：Solar Energy Materials and Solar Cells
出版年：2016
出版时间：January 2016
年：2016
卷：144
期：Complete
页码：210-220
全文大小：2703 K

文摘

•: A PL based quality control method for heterojunction solar cells is presented.
•: FF losses are correlated to a defectivity parameter extracted from PL images.
•: The efficiency of non-metallized cells can be predicted with deviations below 0.2%.
•: The origin of the defects revealed by PL imaging is also investigated.

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