Investigation on the simultaneous removal of fluoride, ammonia nitrogen and phosphate from semiconductor wastewater using chemical precipitation

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Investigation on the simultaneous removal of fluoride, ammonia nitrogen and phosphate from semiconductor wastewater using chemical precipitation

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作者：Haiming Huang ; Jiahui Liu ; Peng Zhang ; Dingding Zhang ; Faming Gao ; ^{fmgao@ysu.edu.cn" class="auth_mail" title="E-mail the corresponding author}
关键词：Ammonia nitrogen ; Phosphate ; Fluoride ; Struvite ; Semiconductor wastewater
刊名：Chemical Engineering Journal
出版年：2017
出版时间：1 January 2017
年：2017
卷：307
期：Complete
页码：696-706
全文大小：3047 K

文摘

•: Treatment of semiconductor wastewater by chemical precipitation was investigated.
•: Removal of fluoride by Mg²⁺ showed good performance.
•: Fluoride ions exert a significant inhibitory effect on struvite crystallization.
•: Bittern is suitable to treat semiconductor wastewater.
•: PO₄-P and F⁻ can be efficiently removed using the two-stage precipitation process.

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