Structural and electrical studies of thermally evaporated nanostructured CdTe thin films

详细信息    查看全文

• 作者：Sukhvir Singh ; Rajeev Kumar ; K.N. Sood
• 关键词：Nanostructures ; Semiconductors ; Microstructures ; VDS Technique ; Thermal evaporation
• 刊名：Thin Solid Films
• 出版年：2010
• 出版时间：30 November 2010
• 年：2010
• 卷：519
• 期：3
• 页码：1078-1081
• 全文大小：911 K

文摘

CdTe thin films were deposited on KCl and glass substrates using thermal evaporation technique under high vacuum conditions. CdTe bulk compound grown by vertical directional solidification (VDS) technique was used as the source material to deposit thin films. Powder X-ray diffraction technique was employed to identify the phase of the as grown bulk CdTe compound as well as its thin films. Surface morphology and the stoichiometry of the bulk compound and thin films was carried out by using scanning electron microscope (SEM) with an attachment of energy dispersive spectrometer(EDS). Microstructural features associated with the as deposited CdTe thin films were studied by using transmission electron microscope (TEM). The films deposited on to glass substrates at different temperatures have been used to study the I–V characteristics of the films. These parameters have been studied in detail in order to prepare good quality nanostructured thin films of CdTe compound. CdTe bulk compound grown by VDS method and its thin films prepared by thermal evaporation method found to have single phase with cubic structure. Size of the particles in the as deposited films vary between 5 and 40 nm In the present study efforts have been made to correlate the electrical and optical properties of the CdTe thin films with the corresponding microstructural features associated with them.