Characterization of proton and neutron irradiated low resistivity p-on-n magnetic Czochralski ministrip sensors and diodes

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• 作者：Nicola Pacifico^a ;   ; ^{nicola.pacifico@cern.ch} ; Irena Dolenc Kittelmann^a ; Manuel Fahrer^a ; Michael Moll^a ; Otilia Militaru^b
• 关键词：TCT ; CCE ; Edge-TCT ; Annealing ; MCz ; Silicon detectors ; RD50
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2011
• 出版时间：1 December 2011
• 年：2011
• 卷：658
• 期：1
• 页码：55-60
• 全文大小：1025 K

文摘

Transient Current Technique (TCT) and Charge Collection Efficiency (CCE) measurements were performed on low resistivity () n-bulk, p-readout magnetic Czochralski ministrip sensors and diodes. The detectors were irradiated with neutrons and 24 GeV/c protons up to a total NIEL equivalent fluence of . The study was addressed to assess the radiation tolerance of the detectors up to fluences expected in the next generations of High Energy Physics experiments. The charge collection efficiency after irradiation was found to be much higher than for standard FZ silicon p-in-n sensors. The underlying physics of this remarkable result was investigated by performing Edge-TCT measurements on one of the neutron irradiated ministrip sensors to extract detailed informations about the field and efficiency profiles of the detector.