Digital image correlation method for calculating coefficients of Williams expansion in compact tension specimen

详细信息    查看全文

• 作者：Majid R. Ayatollahi ; ^{m.ayat@iust.ac.ir} ; Mostafa Moazzami
• 关键词：Coefficients of higher-order terms ; Crack ; Digital image correlation ; Stress intensity factor (SIF) ; T-stress
• 刊名：Optics and Lasers in Engineering
• 出版年：2017
• 出版时间：March 2017
• 年：2017
• 卷：90
• 期：Complete
• 页码：26-33
• 全文大小：1496 K
• 卷排序：90

文摘

The DIC method was employed to find the crack tip parameters for a CT specimen. Higher-order coefficients of Williams expansion were determined using DIC method. FEOD method was also used for calculating higher-order coefficients for CT specimen. Good agreement was found between the results of DIC and FEOD methods.