Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy

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• 作者：Chi-Yuan Lin ; Cheng-En Cheng ; Shuai Wang ; Hung Wei Shiu ; Lo Yueh Chang ; Chia-Hao Chen ; Tsung-Wu Lin ; Chen-Shiung Chang ; Forest Shih-Sen Chien
• 刊名：Journal of Physical Chemistry C
• 出版年：2015
• 出版时间：June 11, 2015
• 年：2015
• 卷：119
• 期：23
• 页码：12910-12915
• 全文大小：314K
• ISSN：1932-7455

文摘

Synchrotron radiation soft X-ray was employed to reduce graphene oxide (GO) films in ultrahigh vacuum. The dissociation of oxygen-containing functional groups, and the formation of sp² C鈥揅 bonds were revealed by time-resolved in situ X-ray photoelectron spectroscopy, demonstrating the X-ray reduction of GO. The number of C鈥揙 bonds of GO exhibited an exponential decay with exposure time. The X-ray reduction rate of GO was positively correlated with the intensity of low-energy secondary electrons excited from substrates by soft X-ray, indicating the C鈥揙 bonds were dissociated by secondary electrons.