Electromechanical Properties of Self-Assembled Monolayers of Tetrathiafulvalene Derivatives Studied by Conducting Probe Atomic Force Microscopy

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• 作者：Lindsay R. Ditzler ; Chandana Karunatilaka ; Venkat R. Donuru ; Haiying Y. Liu ; Alexei V. Tivanski
• 刊名：Journal of Physical Chemistry C
• 出版年：2010
• 出版时间：March 18, 2010
• 年：2010
• 卷：114
• 期：10
• 页码：4429-4435
• 全文大小：193K
• 年卷期：v.114,no.10(March 18, 2010)
• ISSN：1932-7455

文摘

The electrical conduction of metal−molecule−metal junctions formed between Au-supported self-assembled monolayers (SAMs) of symmetric tetrathiafulvalene (TTF) derivatives and a Pt-coated atomic force microscope (AFM) tip has been measured under different compression forces using conducting probe AFM. The TTFs are linked to the metal through double metal−thiol linkers on both sides of the molecule. The TTF junctions exhibit remarkably high electrical conduction with estimated single molecule resistance of 14.7 ± 3.4 GΩ, corresponding to the molecular resistivity of 390 Ω·cm. A single molecule resistance of a comparable length 1-decanethiol molecule is estimated to be several orders of magnitude higher with the value of 950 ± 22 GΩ. The TTF junction resistance displayed a unique nonlinear dependence with the compression force. The dependence is attributed to the change in the intermolecular electronic coupling between the TTF molecules.