SESAM fabrication errors and its influence on ultrafast laser cavity design
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  • 作者:Sha Wang (1)
    Guo-ying Feng (1)
    Shou-huan Zhou (1) (2)

    1. Institute of Laser & Micro/Nano Engineering
    ; College of Electronics and Information Engineering ; Sichuan University ; Chengdu ; 610064 ; China
    2. North China Research Institute of Electro-Optics
    ; Beijing ; 100015 ; China
  • 关键词:Semiconductor saturable absorber mirror (SESAM) ; Ultrafast laser ; Fabrication error ; Design criteria ; TN248.1 ; 鍙ケ鍜屽惛鏀堕暅 ; 椋炵婵€鍏夊櫒 ; 鍒堕€犺宸?/li> 鑵斿瀷 璁捐
  • 刊名:Journal of Zhejiang University - Science A
  • 出版年:2015
  • 出版时间:April 2015
  • 年:2015
  • 卷:16
  • 期:4
  • 页码:326-334
  • 全文大小:991 KB
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  • 刊物类别:Engineering
  • 刊物主题:Physics
    Mechanics, Fluids and Thermodynamics
    Chinese Library of Science
  • 出版者:Zhejiang University Press, co-published with Springer
  • ISSN:1862-1775
文摘
During mode-locked ultrafast laser experiments, we find that semiconductor saturable absorber mirrors (SESAMs) from the same manufacturing process may, from batch to batch, show different working ranges: pure Q-switching, Q-switched mode-locking, and continuous wave (CW) mode-locking. This is because, in high-volume wafer-scale fabrication, there is typically an estimated 1% error for high-quality molecular beam epitaxy (MBE) growth, which introduces a variation in the parameters of an individual SESAM. In this paper, we will analyze how that 1% error in layer thickness influences the behaviour of SESAMs in three different structures: resonant SESAM, anti-resonant SESAM, and enhanced SESAM. Furthermore, the characteristics of the SESAM will affect the mode-locking dynamic behavior of ultrafast solid state lasers. In the worst case, a SESAM with a fabrication error may prevent the laser cavity from mode-locking. Proper laser cavity design can help to reduce the impact of SESAM fabrication errors on laser performance and maintain the laser in the CW mode-locking range.
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