Morphology and Growth Kinetics of Straight and Kinked Tin Whiskers

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• 作者：Donald Susan (1)
  Joseph Michael (1)
  Richard P. Grant (1)
  Bonnie McKenzie (1)
  W. Graham Yelton (1)
  
• 刊名：Metallurgical and Materials Transactions A
• 出版年：2013
• 出版时间：March 2013
• 年：2013
• 卷：44
• 期：3
• 页码：1485-1496
• 全文大小：1581KB
• 参考文献：1. NASA Goddard Space Flight Center Tin Whisker Homepage, website http://nepp.nasa.gov/whisker/.
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• 作者单位：Donald Susan (1)
  Joseph Michael (1)
  Richard P. Grant (1)
  Bonnie McKenzie (1)
  W. Graham Yelton (1)
  
  1. Sandia National Laboratories, Albuquerque, NM, 87185, USA
  
• ISSN：1543-1940

文摘

Time-lapse SEM studies of Sn whiskers were conducted to estimate growth kinetics and document whisker morphologies. For straight whiskers, growth rates of 3 to 4聽microns per day were measured at room temperature. Two types of kinked whiskers were observed. For Type A kinks, the original growth segment spatial orientation remains unchanged, there are no other changes in morphology or diameter, and growth continues. For Type B kinks, the spatial orientation of the original segment changes and it appears that the whisker bends over. Whiskers with Type B kinks show changes in morphology and diameter at the base, indicating grain boundary motion in the film, which eliminates the conditions suitable for long-term whisker growth. To estimate the errors in the whisker growth measurements, a technique is presented to correct for SEM projection effects. With this technique, the actual growth angles and lengths of a large number of whiskers were collected. It was found that most whiskers grow at moderate or shallow angles with respect to the surface; few straight whiskers grow nearly normal to the surface. In addition, there is no simple correlation between growth angles and lengths for whiskers observed over an approximate 2-year period.