Optical and microstructural studies on laser ablated nanocrystalline CeO2 thin films

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• 作者：P. Nagaraju ; Y. Vijayakumar ; M. V. Ramana Reddy
• 关键词：cerium oxide ; pulsed laser deposition ; microstructure ; optical band gap ; AFM
• 刊名：Glass Physics and Chemistry
• 出版年：2015
• 出版时间：September 2015
• 年：2015
• 卷：41
• 期：5
• 页码：484-488
• 全文大小：635 KB
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• 作者单位：P. Nagaraju (1)
  Y. Vijayakumar (2)
  M. V. Ramana Reddy (2)
  
  1. CMR Technical Campus, Hyderabad, 501401, India
  2. Department of Physics, Osmania University, Hyderabad, 500007, India
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Ceramics,Glass,Composites,Natural Materials
  Characterization and Evaluation Materials
  Materials Science
  Physical Chemistry
  Russian Library of Science
  
• 出版者：MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
• ISSN：1608-313X

文摘

Cerium oxide thin films are deposited on quartz substrate using pulsed laser deposition technique at a substrate temperature 973 K with an oxygen partial pressure of 0.2 Pa. The properties of the grown films mainly depend on the quality of the deposition. In the present investigation the deposition is carried out using excimer laser (KrF). To improve the microstructure and crystallite properties the deposited thin films are annealed at 1073 K for 2 h. The prepared and annealed thin films characterized by X-ray diffraction, atomic force microscope (AFM) and UV-visible spectroscopy: X-ray diffraction analysis confirmed the polycrystalline nature of the thin films. Crystallite size, lattice constant and texture coefficient are calculated. The film thickness is measured using XP-1 stylus profiler, optical band gap has been carried out and surface roughness has been estimated from AFM. Keywords cerium oxide pulsed laser deposition microstructure optical band gap AFM