SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE

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• 作者：Florence Azaïs ; Stéphane David-Grignot ; Laurent Latorre…
• 关键词：Analog signals ; Digital ATE ; Digital signal processing ; Noise measurement ; One bit acquisition ; Phase noise ; Ssb phase noise ; Analog/RF integrated circuits ; Test cost reduction
• 刊名：Journal of Electronic Testing
• 出版年：2016
• 出版时间：February 2016
• 年：2016
• 卷：32
• 期：1
• 页码：69-82
• 全文大小：3,459 KB
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  3.Angrisani L, Baccigalupi A, D’Arco M (2004) “Evaluating phase noise power spectrum with variable frequency resolution”, IEEE Trasn Instrum Meas, 53(3):685–691, June
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  5.David-Grignot S, Azais F, Latorre L, Lefevre F (2014) “Low-cost phase noise testing of complex RF ICs using standard digital ATE,” Proc. IEEE Int’l Test Conference (ITC), paper 9.1, Oct
  6.David-Grignot S, Azais F, Latorre L, Lefevre F (2015) “Phase noise testing of analog/IF signals using digital ATE: a new post-processing algorithm for extended measurement range,” J. of Electronic Testing: Theory and Applications (JETTA), 31(5-6):443–460, Dec
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  14.Lefevre F, Azais F, David-Grignot S, Latorre L (2013) “Method and apparatus for measuring phase noise”, Patent application 81582852EP01, filed Oct
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• 作者单位：Florence Azaïs (1)
  Stéphane David-Grignot (1) (2)
  Laurent Latorre (1)
  François Lefevre (2)
  
  1. LIRMM, CNRS, Université Montpellier, 161 rue Ada, , 34095, Montpellier Cedex 5, France
  2. NXP Semiconductors, 2 Espl. Anton Phillips, 14000, Caen, France
  
• 刊物类别：Engineering
• 刊物主题：Circuits and Systems
  Electronic and Computer Engineering
  Computer-Aided Engineering and Design
  
• 出版者：Springer Netherlands
• ISSN：1573-0727

文摘

This paper presents a low-cost solution for the evaluation of frequency-domain phase noise characteristics for analog/IF signals. The technique is based on 1-bit signal acquisition with a standard digital channel of an Automated Test Equipment (ATE) and a dedicated post-processing algorithm that permits to reconstruct the time-domain phase fluctuations of the analog/RF signal from the captured binary vector. Single SideBand (SSB) phase noise is then obtained based on FFT applied on the reconstructed phase fluctuations. Simulation results demonstrate a very good agreement between SSB phase noise obtained using the proposed digital method and the conventional analog method on a large range of measurement frequency offset. The digital method also permits spur detection and exhibits similar performance than the conventional method in terms of measurement variability. The technique is also validated through hardware measurements on a practical case study, i.e. SSB phase noise evaluation on the 1.3125 MHz sinusoidal signal delivered by the transceiver of a JN5168 wireless microcontroller. Keywords Analog signals Digital ATE Digital signal processing Noise measurement One bit acquisition Phase noise Ssb phase noise Analog/RF integrated circuits Test cost reduction