摘要
为了提升微偏振片阵列型长波红外成像系统精度,在误差分析的基础上,针对入射光偏振信息计算问题,提出了一种偏振定标方法.通过确定像元级响应值与入射光功率的关系,引入广义光学透过率,不依赖大规模方程组运算,实现了消光比、偏振方向的计算,获取了微偏振片穆勒矩阵内各元素值.用固定盲元干扰下的超级像元内偏振信息计算法完成入射光偏振信息计算.实验结果表明,该定标方法可有效降低误差干扰,提高微偏振片阵列型长波红外成像系统探测精度.
To improve the precision of micro-polarizer array long-wave infrared imaging system,for the incident light's polarimetric information calculation problem,a polarimetric calibration method is proposed based on error analysis.By determining the relationship between the pixel level response values and the incident light power,the generalized optical transmittance is introduced to derive and achieve the calculation of the extinction ratio and polarization orientation,further obtain the values of elements in the micro-polarizer Mueller matrix independent of large scale equations.A method to compute polarimetric information in one super pixel which contains fixed position blind pixels is proposed,contribute to getting the incident light's polarimetric information precisely.The experiments show that this calibration method can effectively reduce error interference,and improve the detection accuray of micro-polarizer array longwave infrared imaging system.
引文
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