摘要
通过对多晶硅光伏组件进行EL、最大功率、湿热、PID等测试,归纳总结了短期运行(五年以内)后多晶硅光伏组件的一些质量问题。测试结果表明:在运行四年多以后,光伏组件存在较大比例的隐裂、碎片问题,一定比例的组件功率衰减超出预期;部分光伏组件PID试验后出现较为明显的功率衰减;部分光伏组件湿热试验后封装材料变黄,功率衰减明显。为短期运行后光伏组件的质量状况以及光伏电站的建设、运行和维护提供数据参考。
Some quality problems of polysilicon PV modules after short-term operation(less than five years)are summarized by EL,maximum power,humidity and heat,and PID tests. The test results show that after more than four years of operation,there are a large proportion of cracks and debris in PV modules,and a certain proportion of power degradation exceeds expectations;some PV modules have obvious power degradation after PID test;some photovoltaic modules have yellowing packaging materials and obvious power degradation after wet-heat test. It provides data reference for the quality of PV modules after short-term operation,as well as the construction,operation and maintenance of PV stations.
引文
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