嵌入式软件测试技术的研究及其在闪存文件系统测试中的应用
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摘要
随着科技的发展,嵌入式系统在家电、互连网、航天航空等各个领域的应用日益广泛。嵌入式软件作为嵌入式系统的核心,其质量保证对整个系统至关重要。然而嵌入式软件作为一种特殊的软件产品,其质量保证不同于普通软件,如何建立一套简单高效的测试系统,一直是嵌入式软件开发的难点。
     嵌入式文件系统是嵌入式操作系统的重要组成部分。NAND FLASH以其大容量低价格等优势迅速成为嵌入式系统存储的新宠,因此其上的文件系统研究也日益广泛。
     本文从软件产品测试的基本知识、理论入手,分析研究了针对于嵌入式软件的测试系统配置、测试方法和测试策略,提出了嵌入式软件测试解决方案。以专门针对NAND FLASH设计的闪存文件系统YAFFS(Yet Another Flash FileSystem)为实例,使用白盒测试策略及仿真技术对YAFFS文件系统在均匀损耗、掉电恢复和动态内存占用三个主要方面的性能进行在线测试。
     本文给出测试结果的同时,着重研究嵌入式软件测试方案和方法,对其他嵌入式软件测试具有一般借鉴意义。同时文章还对测试结果进行分析,并提出了改进意见、方案和适用环境。
With the development of science and technology, the application of embedded system in many fields, such as Internet and aerospace etc, has become more and more popular. As the kernel of the whole system, the quality assurance of the embedded software is very critical. But as a special software product, the quality assurance of embedded software is different from general software. It is difficult to construct a high performance testing system in embedded software developing process.
     Embedded file system is one of the important parts of Embedded Operating System. As its large capacity and low price, NAND FLASH quickly accepted by the market, so the research on its file system became increasingly popular.
     Based on the knowledge and theory of software testing, this thesis puts forward a solution for the software product testing after analyzing and investigating the testing configuration, method and strategy of the embedded systems. White box testing strategy and simulation technique is used to test the wear-leveling, drop-resume and dynamic memory distribution of YAFFS file system, which is specially designed for NAND FLASH.
     This thesis not only gives the testing results, but also investigates the testing scheme and method of embedded software, so it can be used for reference in the testing of other embedded software. An improved scheme is also advanced in the end of the thesis.
引文
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