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内部出版物
CNKI学位论文(120)
知网期刊论文(137)
在“
SpringerLink电子期刊
”中,
命中:
6
条,耗时:0.0489793 秒
在所有数据库中总计命中:
257
条
1.
The
radiation
hardness
of the nitrogen-fluorine implanted buried oxide layer in silicon-on-insulator materials against higher
total
dose
ir
radiation
作者:
Zhongshan Zheng 郑中山
;
Jin Ning 宁瑾
;
Baiqiang Zhang 张百强
…
关键词:
silicon
;
on
;
insulator
;
total
dose
radiation
hardness
;
nitrogen implantation
;
fluorine implantation
刊名:Science China Materials
出版年:2016
2.
Rational methodological approach to evaluation of
dose
resistance of CMOS microcircuits with respect to low intensity effects
作者:
D. V. Boychenko (1) (2)
O. A. Kalashnikov (1) (2)
A. B. Karakozov (1) (2)
A. Yu. Nikiforov (1) (2)
1. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
;
Moscow
;
Russia
2. JSC Specialized Electronic Systems (SPELS)
;
Moscow
;
Russia
刊名:Russian Microelectronics
出版年:2015
3.
Evaluation of groundwater quality based on radiological and hydrochemical data from two uraniferous regions of Western Iberia: Nisa (Portugal) and Ciudad Rodrigo (Spain)
作者:
A. J. S. C. Pereira
;
M. D. Pereira
;
L. J. P. F. Neves…
关键词:
Groundwater
;
Quality
;
Major and trace elements
;
Radioisotopes
;
U
;
Iberia
刊名:Environmental Earth Sciences
出版年:2015
4.
Luminescence properties of a Lu2O3:Eu3+ nano-phosphor and
radiation
hardness
measurements with a proton beam
作者:
Myeongjin Oh (1)
H. J. Kim (1)
Sunghwan Kim (2)
ChongKyu Cheon (3)
关键词:
Lu2O3
;
Eu3+
;
Phosphor
;
Luminescence
;
Radiation
hardness
刊名:Journal of the Korean Physical Society
出版年:2012
5.
Methods for the Prediction of
Total
-
Dose
Effects on Modern Integrated Semiconductor Devices in Space: A Review
作者:
V. V. Belyakov
;
V. S. Pershenkov
;
G. I. Zebrev
;
A. V. Sogoyan
;
A. I. Chumakov
;
A. Y. Nikiforov and P. K. Skorobogatov
刊名:Russian Microelectronics
出版年:2003
6.
Methods for the Prediction of
Total
-
Dose
Effects on Modern Integrated Semiconductor Devices in Space: A Review
作者:
V. V. Belyakov
;
V. S. Pershenkov
;
G. I. Zebrev
;
A. V. Sogoyan
;
A. I. Chumakov
;
A. Y. Nikiforov and P. K. Skorobogatov
刊名:Russian Microelectronics
出版年:2003
1
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