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CNKI学位论文(982)
CNKI期刊论文0611(2)
知网期刊论文(891)
在“
Wiley电子期刊
”中,
命中:
17
条,耗时:小于0.01 秒
在所有数据库中总计命中:
1,876
条
1.
Coherent X-ray
beam
metrology
using 2D high-resolution Fresnel-diffraction analysis
作者:
M. Ruiz-Lopez
;
A. Faenov
;
T. Pikuz
;
N. Ozaki
;
A. Mitrofanov
;
B. Albertazzi
;
N. Hartley
;
T. Matsuoka
;
Y. Ochante
;
Y. Tange
;
T. Yabuuchi
;
T. Habara
;
K. A. Tanaka
;
Y. Inubushi
;
M. Yabashi
;
M. Nishikino
;
T. Kawachi
;
S. Pikuz
;
T. Ishikawa
;
R. Kodama and D. Bleiner
关键词:
X-ray
;
beam
metrology
;
Fresnel diffraction
;
fourth-generation source
;
SACLA
;
LiF
;
X-ray imaging detector
;
color centers
刊名:Journal of Synchrotron Radiation
出版年:2017
2.
X-ray grating interferometer for
in situ
and at-wavelength wavefront
metrology
作者:
Yves Kayser
;
Christian David
;
Uwe Flechsig
;
Juraj Krempasky
;
Volker Schlott and Rafael Abela
关键词:
X-ray grating interferometry
;
wavefront
metrology
;
X-ray optics
;
XFELs
刊名:Journal of Synchrotron Radiation
出版年:2017
3.
Encapsulation and backsheet adhesion
metrology
for photovoltaic modules
作者:
Jared Tracy
;
Nick Bosco
;
Fernando Novoa and Reinhold Dauskardt
刊名:Progress in Photovoltaics: Research and Applications
出版年:2017
4.
GIMPy: a software for the simulation of X-ray fluorescence and reflectivity of layered materials
作者:
Fabio Brigidi and Giancarlo Pepponi
刊名:X-Ray Spectrometry
出版年:2017
5.
The at-wavelength
metrology
facility for UV- and XUV-reflection and diffraction optics at BESSY-II
作者:
F. Schä
;
fers
;
P. Bischoff
;
F. Eggenstein
;
A. Erko
;
A. Gaupp
;
S. Kü
;
nstner
;
M. Mast
;
J.-S. Schmidt
;
F. Senf
;
F. Siewert
;
A. Sokolov and Th. Zeschke
关键词:
reflectometer
;
c-PGM
beam
line
;
at-wavelength
metrology
;
polarimetry
;
reflectivity
;
diffraction gratings
;
XUV optical elements
刊名:Journal of Synchrotron Radiation
出版年:2016
6.
DABAM: an open-source database of X-ray mirrors
metrology
作者:
Manuel Sanchez del Rio
;
Davide Bianchi
;
Daniele Cocco
;
Mark Glass
;
Mourad Idir
;
Jim Metz
;
Lorenzo Raimondi
;
Luca Rebuffi
;
Ruben Reininger
;
Xianbo Shi
;
Frank Siewert
;
Sibylle Spielmann-Jaeggi
;
Peter Takacs
;
Muriel Tomasset
;
Tom Tonnessen
;
Amparo Vivo and Valeriy Yashchuk
关键词:
X-ray mirror
;
metrology
;
database
;
Python
;
statistics
刊名:Journal of Synchrotron Radiation
出版年:2016
7.
Creating flat-top X-ray
beam
s by applying surface profiles of alternating curvature to deformable piezo bimorph mirrors
作者:
John P. Sutter
;
Simon G. Alcock
;
Yogesh Kashyap
;
Ioana Nistea
;
Hongchang Wang and Kawal Sawhney
关键词:
X-ray
;
bimorph
;
mirror
;
beam
shaping
;
re-entrant
刊名:Journal of Synchrotron Radiation
出版年:2016
8.
One-dimensional ion-
beam
figuring for grazing-incidence reflective optics
作者:
Lin Zhou
;
Mourad Idir
;
Nathalie Bouet
;
Konstantine Kaznatcheev
;
Lei Huang
;
Matthew Vescovi
;
Yifan Dai and Shengyi Li
关键词:
ion
beam
figuring
;
synchrotron optics
;
one-dimensional
刊名:Journal of Synchrotron Radiation
出版年:2016
9.
Development of a speckle-based portable device for
in situ
metrology
of synchrotron X-ray mirrors
作者:
Yogesh Kashyap
;
Hongchang Wang and Kawal Sawhney
关键词:
speckle
;
X-ray optics
;
metrology
刊名:Journal of Synchrotron Radiation
出版年:2016
10.
Towards high-flux X-ray
beam
compressing channel-cut monochromators
作者:
Karol Vé
;
gsö
;
Matej Jergel
;
Peter Šiffalovič
;
Eva Majková
;
Dušan Korytá
r ;
Zdenko Zá
;
pražný
;
Petr Mikulí
;
k and Patrik Vagovič
关键词:
X-ray
beam
compressing channel-cut monochromators
;
single-point diamond technology
;
X-ray diffraction
;
small-angle X-ray scattering
;
grazing-incidence small-angle X-ray scattering
;
SAXS/GISAXS
刊名:Journal of Applied Crystallography
出版年:2016
1
2
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