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在“
Elsevier电子期刊
”中,
命中:
124,485
条,耗时:0.2278914 秒
在所有数据库中总计命中:
154,551
条
1.
New hardware and workflows for semi-automated correlative cryo-fluorescence and cryo-
electron
microscopy
/tomography
作者:
Martin Schor
b
a
;
b
;
Leander Gaechter
c
;
Ori Avinoam
a
;
Frank Sieckmann
d
;
Mairi Clarke
a
;
Cecilia
B
e
b
eacua
a
;
e
;
Yury S.
B
ykov
a
;
Andreas F.-P. Sonnen
a
;
f
;
Reinhard Lihl
g
;
John A.G.
B
riggs
a
;
e
;
f
;
john.
b
riggs@em
b
l.de
关键词:
CLEM
;
correlative light and
electron
microscopy
;
CEMOVIS
;
cryo-
electron
microscopy
of vitrified sections
;
EM
;
electron
microscopy
;
ET
;
electron
tomography
;
FM
;
fluorescence
microscopy
;
FOV
;
field of view
;
LN
;
liquid nitrogen
;
NA
;
numerical aperture
;
POI
;
position(s) of interest
;
TEM
;
transmission
electron
microscopy
;
WD
;
working distance
刊名:Journal of Structural
B
iology
出版年:2017
2.
Visualization of Aspergillus fumigatus
b
iofilms with Scanning
Electron
Microscopy
and Varia
b
le Pressure-Scanning Electron Microscopy: A comparison of processing techniques
作者:
Lydia-Marie Jou
b
ert
a
;
lydiaj@stanford.edu
;
Jose AG Ferreira
b
;
c
;
1
;
David A Stevens
b
;
c
;
Hasan Nazik
b
;
c
;
2
;
Lynette Cegelski
d
关键词:
B
SE
;
B
ackscattered
Electron
;
CF
;
cystic fi
b
rosis
;
CPD
;
critical point drying
;
ECM
;
extracellular matrix
;
EPS
;
extracellular polymeric su
b
stances
;
ET
;
Everhart-Thornley
;
FESEM
;
Field Emission Scanning
Electron
Microscopy
;
GA
;
glutaraldehyde
;
HMDS
;
hexamethyldisilazane
;
NMR
;
Nuclear Magnetic Resonance
;
OsO4
;
osmium tetroxide
;
P
B
S
;
phosphate-
b
uffered saline
;
PFA
;
paraformaldehyde
;
SE
;
Secondary
Electron
;
SEM
;
Scanning
Electron
Microscopy
;
SNR
;
Signal to Noise Ratio
;
VP-SEM
;
Varia
b
le Pressure-SEM
刊名:Journal of Micro
b
iological Methods
出版年:2017
3.
Composition quantification of
electron
-transparent samples
b
y
b
ackscattered
electron
imaging in scanning
electron
microscopy
作者:
E. Mü
;
ller
;
erich.mueller@kit.edu
;
D. Gerthsen
关键词:
Scanning
electron
microscopy
;
B
ackscattered
electron
s
;
Low
electron
energy
;
Composition quantification
;
InGaAs
刊名:Ultra
microscopy
出版年:2017
4.
Three-dimensional imaging of individual point defects using selective detection angles in annular dark field scanning transmission
electron
microscopy
作者:
Jared M. Johnson
;
Soohyun Im
;
Wolfgang Windl
;
Jinwoo Hwang
;
hwang.458@osu.edu
关键词:
Scanning transmission
electron
microscopy
;
Point defects
;
Electron
channeling
;
Atomic scale 3D information
刊名:Ultra
microscopy
出版年:2017
5.
B
ioEM: GPU-accelerated computing of Bayesian inference of
electron
microscopy
images
作者:
Pilar Cossio
a
;
1
;
David Rohr
b
;
1
;
Fa
b
io Baruffa
c
;
d
;
Markus Rampp
c
;
Volker Lindenstruth
b
;
Gerhard Hummer
a
;
Gerhard.Hummer@
b
iophys.mpg.de
关键词:
Image analysis
;
Electron
microscopy
;
B
ayesian inference
;
Dynamic
;
Heterogeneous
;
Software
;
MPI
;
GPU
刊名:Computer Physics Communications
出版年:2017
6.
O
b
servation of ionomer in catalyst ink of polymer electrolyte fuel cell using cryogenic transmission
electron
microscopy
作者:
Shinichi Takahashi
a
;
taka-shin@mail.nissan.co.jp
;
Junichi Shimanuki
b
;
Tetsuya Mashio
a
;
Atsushi Ohma
a
;
Hajime Tohma
b
;
Ayumi Ishihara
c
;
d
;
e
;
Yoshiko Ito
c
;
d
;
e
;
Yuri Nishino
d
;
e
;
Atsuo Miyazawa
d
;
e
关键词:
Polymer electrolyte fuel cell
;
catalyst ink
;
catalyst layer
;
ionomer
;
cryogenic transmission
electron
microscopy
刊名:Electrochimica Acta
出版年:2017
7.
Surface potential investigation on interdigitated
b
ack contact solar cells
b
y Scanning
Electron
Microscopy
and Kelvin Pro
b
e Force Microscopy: Effect of electrical
b
ias
作者:
Paul Narchi
a
;
b
;
paul.narchi@polytechnique.edu
;
Vladimir Neplokh
c
;
Valerio Piazza
c
;
Twan
B
earda
d
;
Fa
b
ien Bayle
c
;
Martin Foldyna
b
;
Chiara Toccafondi
b
;
Patricia Prod&rsquo
;
homme
a
;
Maria Tchernycheva
c
;
Pere Roca i Ca
b
arrocas
b
关键词:
AFM
;
Atomic Force
Microscopy
;
a-Si
;
H
;
hydrogenated amorphous silicon
;
I
B
C
;
Interdigitated
B
ack Contact Solar Cell
;
ITO
;
Indium Tin Oxide
;
J(V)
;
current density &ndash
;
voltage
;
KPFM
;
Kelvin Pro
b
e Force
Microscopy
;
SE
;
Secondary
Electron
s
;
SEM
;
Scanning
Electron
Microscopy
刊名:Solar Energy Materials and Solar Cells
出版年:2017
8.
FEMSIM + HRMC: Simulation of and structural refinement using fluctuation
electron
microscopy
for amorphous materials
作者:
Jason J. Maldonis
a
;
jjmaldonis@gmail.com
;
Jinwoo Hwang
b
;
Paul M. Voyles
a
关键词:
Hy
b
rid reverse Monte Carlo
;
Fluctuation
electron
microscopy
;
Reverse structure determination
刊名:Computer Physics Communications
出版年:2017
9.
Enhanced thermal sta
b
ility of a polymer solar cell
b
lend induced
b
y
electron
b
eam irradiation in the transmission
electron
microscope
作者:
Olof
B
ä
;
cke
a
;
o
b
acke@chalmers.se
;
Camilla Lindqvist
b
;
Amaia Diaz de Zerio Mendaza
b
;
Stefan Gustafsson
a
;
Ergang Wang
b
;
Mats R. Andersson
b
;
Christian Mü
;
ller
b
;
Per Magnus Kristiansen
c
;
d
;
Eva Olsson
a
;
eva.olsson@chalmers.se
关键词:
Organic solar cells
;
Electron
irradiation
;
In-situ transmission
electron
microscopy
;
Thermal sta
b
ility
;
Crosslinking
刊名:Ultra
microscopy
出版年:2017
10.
Interaction
b
etween Cr-
b
earing pigments and transparent glaze: A transmission
electron
microscopy
study
作者:
Louisiane Verger
a
;
b
;
louisiane.verger@icmc
b
.cnrs.fr
;
Olivier Dargaud
b
;
Nicolas Menguy
a
;
David Troadec
c
;
Laurent Cormier
a
;
laurent.cormier@impmc.upmc.fr
关键词:
Electron
microscopy
;
Pigments
;
Glaze
;
Color alteration
;
Chromium oxides
刊名:Journal of Non-Crystalline Solids
出版年:2017
1
2
3
4
5
6
7
8
9
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