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在“Elsevier电子期刊”中，命中：80条，耗时：0.1529268 秒

在所有数据库中总计命中：143条

1.Unattended Hospital and Home Sleep Apnea Testing Following Cerebrovascular Events

作者：Mark I. Boulos ; MD ; MSc^* ; ^&dagger ; ; ^{mark.boulos@sunnybrook.ca} ; Sara Elias ; MD^* ; ^&dagger ; ; Anthony Wan ; BHSc^* ; ^&dagger ; ; James Im ; BSc^* ; ^&dagger ; ; Fadi Frankul ; MD^* ; ^&dagger ; ; Mina Atalla ; BSc^* ; ^&dagger ; ; Sandra E. Black ; MD^* ; ^&dagger ; ; Vincenzo S. Basile ; MD^* ; ^&dagger ; ; Arun Sundaram ; MD^* ; ^&dagger ; ; Julia J. Hopyan ; MD^* ; ^&dagger ; ; Karl Boyle ; MB ; MSc^* ; ^&dagger ; ; David J. Gladstone ; MD ; PhD^* ; ^&dagger ; ; Richard H. Swartz ; MD ; PhD^* ; ^&dagger ; ; Brian J. Murray ; MD^* ; ^&dagger ;

关键词：Home sleep apnea testing ; portable sleep monitoring ; obstructive sleep apnea ; stroke ; transient ischemic attack ; feasibility

刊名：Journal of Stroke and Cerebrovascular Diseases

出版年：2017

2.Image analysis of single event transient effects on charge coupled devices irradiated by protons

作者：Zujun Wang^a ; ^{wangzujun@nint.ac.cn" class="auth_mail" title="E-mail the corresponding author} ; Yuanyuan Xue^a ; Jing Liu^b ; Baoping He^a ; Zhibin Yao^a ; Wuying Ma^a

关键词：Charge-coupled devices (CCD) ; Single event transient (SET) effects ; Displacement damage (DD) effects ; Proton radiation ; Dark signal spike

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2016

3.Single Event Transient acquisition and mapping for space device Characterization

作者：Roberta Pilia^a ; ^{roberta.pilia90@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; Guillaume Bascoul^b ; Kevin Sanchez^c ; Giovanna Mura^a ; Fulvio Infante^b

关键词：Pulsed laser stimulation ; Single Event Transient ; Sensitivity localization ; Analog device

刊名：Microelectronics Reliability

出版年：2016

4.Permanent and single event transient faults reliability evaluation EDA tool

作者：Y.Q. de Aguiar^a ; ^b ; ^{yqaguiar@inf.ufrgs.br" class="auth_mail" title="E-mail the corresponding author} ; A.L. Zimpeck^b ; C. Meinhardt^a ; ^b ; R. Reis^b

关键词：Stuck-On ; Stuck-Open ; Single Event Transient ; EDA

刊名：Microelectronics Reliability

出版年：2016

5.Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT

作者：Yabin Sun^a ; Jun Fu^b ; Yudong Wang^b ; Wei Zhou^b ; Zhihong Liu^b ; Xiaojin Li^a ; Yanling Shi^a ; ^{ylshi@ee.ecnu.edu.cn" class="auth_mail" title="E-mail the corresponding author}

关键词：SiGe HBT ; Single-event transient ; Bias dependence ; Pulsed laser irradiation

刊名：Microelectronics Reliability

出版年：2016

6.Hardware implementation of a fault-tolerant Hopfield Neural Network on FPGAs

作者：Juan Antonio Clemente^a ; Author Vitae ; Wassim Mansour^bAuthor Vitae ; Rafic Ayoubi^cAuthor Vitae ; Felipe Serrano^aAuthor Vitae ; Hortensia Mecha^aAuthor Vitae ; Haissam Ziade^dAuthor Vitae ; Wassim El Falou^dAuthor Vitae ; Raoul Velazco^bAuthor Vitae

关键词：Artificial Neural Network (ANN) ; Hopfield Neural Network (HNN) ; Single Event Upset (SEU) ; Single Event Transient (SET) ; FPGA ; Fault tolerance

刊名：Neurocomputing

出版年：2016

7.An SEU resilient, SET filterable and cost effective latch in presence of PVT variations

作者：Aibin Yan^a ; ^b ; ^{abyan@mail.ustc.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Huaguo Liang^c ; ^{huagu1g@hfut.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Zhengfeng Huang^c ; ^{huangzhengfeng@139.com" class="auth_mail" title="E-mail the corresponding author} ; Cuiyun Jiang^d ; ^{hgdyun@foxmail.com" class="auth_mail" title="E-mail the corresponding author} ; Yiming Ouyang^b ; ^{oyymbox@163.com" class="auth_mail" title="E-mail the corresponding author} ; Xuejun Li^a ; ^{xjli@ahu.edu.cn" class="auth_mail" title="E-mail the corresponding author}

关键词：Transient fault ; Single event upset ; Single event transient ; Soft error ; Radiation hardening ; Circuit reliability

刊名：Microelectronics Reliability

出版年：2016

8.On the prediction of radiation-induced SETs in flash-based FPGAs

作者：S. Azimi ; B. Du ; L. Sterpone ; ^{luca.sterpone@polito.it" class="auth_mail" title="E-mail the corresponding author}

关键词：Radiation sensitivity ; Single Event Transients ; Prediction ; Fault Tolerance ; Flash-based FPGAs

刊名：Microelectronics Reliability

出版年：2016

9.Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation

作者：Maran Ponnambalam^a ; ^{maranponnambalam@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; N. Vinodhkumar^b ; ^{vinodhkumar.cc@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; R. Srinivasan^b ; ^{srinivasanr@ssn.edu.in" class="auth_mail" title="E-mail the corresponding author} ; Premanand Venkatesh Chandramani^a ; ^{premanandc@ssn.edu.in" class="auth_mail" title="E-mail the corresponding author}

关键词：Radiation harderning ; Single event transient (SET) ; Current starved delay cell ; Ring VCO ; Phase displacement ; Radiation hardened by design (RHBD) ; Linear energy transfer (LET)

刊名：Microelectronics Reliability

出版年：2016

10.FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects

作者：W.E. Calienes Bartra^a ; ^{wecbartra@inf.ufrgs.br" class="auth_mail" title="E-mail the corresponding author} ; A. Vladimirescu^b ; ^c ; R. Reis^a

关键词：FDSOI ; Radiation ; Heavy-ion ; Single-event Effects ; SET ; SEU ; Single-Event Transient ; Single-Event Upset ; TCAD

刊名：Microelectronics Reliability

出版年：2016

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