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内部出版物
SpringerLink电子期刊(4)
Elsevier电子期刊(10)
在“
Elsevier电子期刊
”中,
命中:
10
条,耗时:小于0.01 秒
在所有数据库中总计命中:
14
条
1.
Measurement forecast of anomalous threshold voltages in
BCD
LV submicron n-MOSFETs with two artificial intelligence methods
作者:
Shen-Li Chen
;
jackchen@nuu.edu.tw
;
Dun-Ying Shu
关键词:
Bipolar
-
CMOS
-
DMOS
(
BCD
)
;
Fuzzy-neural network (FNN)
;
Grey system (GS)
;
Low-voltage (LV)
;
Threshold voltage (Vth)
刊名:Measurement
出版年:2017
2.
A low energy ASIC for triple-chamber cardiac pacemakers with contact resistance measurement
作者:
Jie Zhang
a
;
Hong Zhang
a
;
hongzhang@mail.xjtu.edu.cn
;
Jiangtao Xu
a
;
Yang Zhao
b
;
Jia Li
a
;
Guoyu Hu
a
;
Jialu Wang
a
;
Ruizhi Zhang
a
;
Yong Lian
b
关键词:
Cardiac pacemaker
;
Programmable stimulator
;
Resistance measurement
;
Low power
;
Triple chamber
;
High voltage
刊名:Microelectronics Journal
出版年:2017
3.
Investigation of ESD protection strategy in high voltage
Bipolar
-
CMOS
-
DMOS
process
作者:
Fei Ma
;
Yan Han
;
Shurong Dong
;
Meng Miao
;
Jianfeng Zheng
;
Jian Wu
;
Cheng-gong Han
;
Kehan Zhu
刊名:Microelectronics Reliability
出版年:2012
4.
A green-switch controller IC for cascade buck-boost converter with seamless transition over entire input and load range
作者:
Jia-Na Lou
;
Xiao-Bo Wu
;
wuxb@vlsi.zju.edu.cn
;
Meng-Lian Zhao
;
Xiao-Lang Yan
关键词:
DC power systems
;
Integrated circuit design
;
Power electronics
;
Switched mode power supplies
刊名:Microelectronics Journal
出版年:2011
5.
Failure mechanisms in advanced
BCD
technology during reliability qualification
作者:
J.G.
;
van Hassel
;
;
;
jan.van.hassel@nxp.com
;
G.A.D.
;
Bock
;
G.
;
van den Berg
刊名:Microelectronics Reliability
出版年:2011
6.
Advanced
BCD
technology for automotive, audio and power applications
作者:
Piet Wessels
;
Maarten Swanenberg
;
Hans van Zwol
;
Benno Krabbenborg
;
Henk Boezen
;
Marco Berkhout
;
Alfred Grakist
关键词:
SOI
;
BCD
;
Automotive CAN transceiver
;
LIN transceiver
;
Class-D audio amplifier
;
Electro luminescent driver
刊名:Solid-State Electronics
出版年:2007
7.
Impact of large angle tilt implantation on the threshold voltages of L
DMOS
transistors on SOI
作者:
Hui Xu
;
Evelyne Lampin
;
Emmanuel Dubois
;
Serge Bardy and Franck Murray
关键词:
BCD
technology
;
Threshold voltage
;
SOI RESURF L
DMOS
LATID
刊名:Materials Science and Engineering: B
出版年:2005
8.
MOSFET-based temperature sensor for standard
BCD
smart power technology
作者:
Miribel-Català
;
P.
;
Montané
;
E.
;
Bota
;
S.A.
;
Puig-Vidal
;
M.
;
Samitier
;
J.
关键词:
Temperature sensors
;
Smart power
;
CMOS
compatible temperature sensor
刊名:Microelectronics Journal
出版年:2001
9.
A porous silicon LED based on a standard
BCD
technology
作者:
Barillaro
;
G.
;
Pieri
;
F.
;
Mastromatteo
;
U.
关键词:
Porous silicon
;
Electroluminescence
;
LED
刊名:Optical Materials
出版年:2001
10.
Reliability issues in 650V high voltage
bipolar
-
CMOS
-
DMOS
integrated circuits
作者:
van der POL
;
Jacob A.
;
Gerritsen
;
Han J.
;
Rongen
;
Rene T.H.
;
Groeneveld
;
Peter P.M.C.
;
Ragay
;
Peter W.
;
et. al.
刊名:Microelectronics Reliability
出版年:1997
1
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