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Springer电子图书(53)
SpringerLink电子期刊(20)
Elsevier电子期刊(43)
在“
Elsevier电子期刊
”中,
命中:
43
条,耗时:小于0.01 秒
在所有数据库中总计命中:
116
条
1.
SGLT2 inhibitors
作者:
I. Dardi
drinderpreet19@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
T.
Kouvatsos
tasha.
kouvatsos
@jefferson.edu" class="auth_mail" title="E-mail the corresponding author
;
S.A. Jabbour
;
serge.jabbour@jefferson.edu" class="auth_mail" title="E-mail the corresponding author
刊名:Biochemical Pharmacology
出版年:2016
2.
A distributed reputation and trust management scheme for mobile peer-to-peer networks
作者:
Basit Qureshi
b.qureshi@bradford.ac.uk
;
Geyong Min
;
g.min@bradford.ac.uk
;
Demetres
Kouvatsos
d.
kouvatsos
@bradford.ac.uk
关键词:
Trust management
;
Trust ratings aggregation
;
Mobile P2P systems
;
Wireless ad-hoc networks
刊名:Computer Communications
出版年:2012
3.
Analytical modeling of an integrated priority and WFQ scheduling scheme in multi-service networks
作者:
Lan Wang
;
Geyong Min
;
Demetres D.
Kouvatsos
;
Xiaolong Jin
关键词:
Quality-of-Serve (QoS)
;
Traffic scheduling
;
Weighted Fair Queueing (WFQ)
;
Performance modeling
;
Markov chains
刊名:Computer Communications
出版年:2010
4.
Dynamic OBS offset allocation in WDM networks
作者:
C. Mouchos
;
A. Tsokanos
;
D.D.
Kouvatsos
关键词:
Wavelength division multiplexing (WDM)
;
Self-similar bursty traffic
;
Optical burst switching (OBS) protocol
;
Just Enough Time (JET) protocol
;
Generalised Exponential (GE) distribution
刊名:Computer Communications
出版年:2010
5.
On the importance of the V
g,max
–V
th
parameter on LTPS TFT stressing behavior
作者:
Despina C. Moschou
;
Giannis P. Kontogiannopoulos
;
Dimitrios N.
Kouvatsos
;
Apostolos T. Voutsas
刊名:Microelectronics Reliability
出版年:2010
6.
On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques
作者:
M.A. Exarchos
;
D.C. Moschou
;
G.J. Papaioannou
;
D.N.
Kouvatsos
;
A. Arapoyanni
;
A.T. Voutsas
关键词:
Poly-Si TFTs
;
SLS ELA crystallization
;
DLTS
;
p-TFT reliability
刊名:Thin Solid Films
出版年:2009
7.
Back gate influence on front channel operation of p-channel double gate polysilicon TFTs
作者:
L. Michalas
;
G.J. Papaioannou
;
D.N.
Kouvatsos
;
A.T. Voutsas
关键词:
p-Channel
;
Coupling effect
;
Double gate TFTs
;
Temperature study
刊名:Thin Solid Films
出版年:2009
8.
Foreword
作者:
Demetres D.
Kouvatsos
;
Madjid Merabti
刊名:Computer Communications
出版年:2010
9.
Hot-carrier stress induced degradation of SLS ELA polysilicon TFTs – Effects of gate width variation and device orientation
作者:
Giannis P. Kontogiannopoulos
;
Filippos V. Farmakis
;
Dimitrios N.
Kouvatsos
;
George J. Papaioannou
;
Apostolos T. Voutsas
关键词:
Thin film transistors
;
Polysilicon
;
Lateral solidification
;
Hot-carrier stress
;
Width-dependent degradation
刊名:Solid-State Electronics
出版年:2008
10.
Investigation of the undershoot effect in polycrystalline silicon thin film transistors
作者:
L. Michalas
;
G.J. Papaioannou
;
D.N.
Kouvatsos
;
A.T. Voutsas
关键词:
Polysilicon TFTs
;
Transient currents
;
Undershoot effect
刊名:Solid-State Electronics
出版年:2008
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